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System and detection method for checking wrong selection of thin film filters based on machine vision

A thin-film filter and machine vision technology, applied in the field of optics, can solve problems such as manual inspection errors, achieve efficiency improvement, avoid inspection errors, and achieve obvious effects of efficiency

Inactive Publication Date: 2019-06-21
AUXORA SHENZHEN
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] In view of the above problems, the present invention provides a system based on machine vision to check whether the thin film filter is wrong, which can avoid the problem of manual inspection errors, and the efficiency is significantly improved

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  • System and detection method for checking wrong selection of thin film filters based on machine vision
  • System and detection method for checking wrong selection of thin film filters based on machine vision
  • System and detection method for checking wrong selection of thin film filters based on machine vision

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Embodiment Construction

[0032] The preferred embodiments provided by the present invention will be specifically described according to the accompanying drawings.

[0033] figure 1 , which is a preferred embodiment of a system for checking whether a thin film filter is picked wrong based on machine vision provided by the present invention. The system for checking whether the thin-film filter is wrong based on machine vision includes a carrier box 10, a spectrum analyzer 20, a detection device 30 and an image comparison system 40, and the carrier box 10 is provided with a device for supplying the thin-film filter. The placement area of ​​the array distribution; the spectrum analyzer 20 is used to perform spectrum analysis on the thin film filter placed in the object box, and transmit the spectrum analysis result to the image comparison system 40; the detection device 30 includes a The lighting assembly 31 for illuminating the selected thin film filters in the object box 10 and for collecting images of...

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Abstract

The invention provides a system for checking the wrong selection of thin film filters based on machine vision. The system comprises a carrying box, a spectrum analyzer, a detecting device and an imagecomparison system; an arrangement area where the thin film filters can be distributed in an array is defined in the carrying box; the spectrum analyzer is used for performing spectrum analysis on thethin film filters arranged in the carrying box and transmitting a spectrum analysis result to the image comparison system; and the detecting device includes an illumination assembly which illuminatesthin film filters which are left after some thin film filters are selected from the carrying box and a camera for performing image acquisition on the thin film filters which are left after some thinfilm filters are selected, and transmitting image acquisition information to the image comparison system. Compared with the prior art, the system and the detection method perform spectrum test on thethin film filters to be detected, select qualified thin film filters, arrange the thin film filters into the detecting device for photo detection, and perform comparison detection in the image comparison analysis system so as to detect whether the thin film filters are wrongly selected or some qualified thin film filters are not selected.

Description

technical field [0001] The invention relates to the field of optics, in particular to a system and a detection method for checking whether a thin-film filter is picked wrong based on machine vision. Background technique [0002] After a batch of thin-film filters have undergone spectral detection and spectral judgment, some of them have poor or qualified spectral characteristics, and it is necessary to manually or machine remove the bad thin-film filters or pick out the qualified thin-film filters separately , In this process, there may be a problem of wrong picking, that is, the bad ones will be picked up as qualified ones, resulting in the failure of the optical device assembled with the thin film filter at the back end. The method of using artificial naked eyes to identify whether the thin-film filter is wrong is inefficient and error-prone. Contents of the invention [0003] In view of the above problems, the present invention provides a system for checking whether a ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
CPCG06T7/0008G06T7/73G06T2207/30164G06T7/0004G06T7/70H04N23/56G02B5/26
Inventor 李京辉朱宏干姚亚星
Owner AUXORA SHENZHEN