System and detection method for checking wrong selection of thin film filters based on machine vision
A thin-film filter and machine vision technology, applied in the field of optics, can solve problems such as manual inspection errors, achieve efficiency improvement, avoid inspection errors, and achieve obvious effects of efficiency
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[0032] The preferred embodiments provided by the present invention will be specifically described according to the accompanying drawings.
[0033] figure 1 , which is a preferred embodiment of a system for checking whether a thin film filter is picked wrong based on machine vision provided by the present invention. The system for checking whether the thin-film filter is wrong based on machine vision includes a carrier box 10, a spectrum analyzer 20, a detection device 30 and an image comparison system 40, and the carrier box 10 is provided with a device for supplying the thin-film filter. The placement area of the array distribution; the spectrum analyzer 20 is used to perform spectrum analysis on the thin film filter placed in the object box, and transmit the spectrum analysis result to the image comparison system 40; the detection device 30 includes a The lighting assembly 31 for illuminating the selected thin film filters in the object box 10 and for collecting images of...
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