Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Electron microscopy sample support including porous metal foil

A technology for electron microscopes and sample holders, applied in circuits, discharge tubes, electrical components, etc., and can solve problems such as changes

Active Publication Date: 2019-07-09
英国研究与创新署
View PDF2 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Typically the electrons forming the electron beam have high energy, and it is understood that bombarding a target (such as a sample for inspection) within the electron beam together with a holder holding the sample in place may result in damage to the holder and / or sample. physical, chemical and / or electrical changes

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Electron microscopy sample support including porous metal foil
  • Electron microscopy sample support including porous metal foil
  • Electron microscopy sample support including porous metal foil

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0073] It is believed that the information content in an electron microscopic image of a sample comprising, for example, nanoscale particles may be defined by: electron beam-induced motion of individual particles; Charge accumulation on a sample induced by a chemical transition. exist Figures 1 to 3 This phenomenon is schematically illustrated in .

[0074] figure 1 Demonstration of electron beam-induced particle motion in transparent ice. figure 1 Illustrates particles, in this example proteins, encased in transparent ice. The sample is irradiated with an electron beam. The electrons that form the beam have energy imparted to the protein sample when they collide with or pass through those protein samples. It is understood that during imaging, the particles under study may rotate and translate after being irradiated with the electron beam, causing blurring of the resulting captured image.

[0075] figure 2 Demonstration of electron beam-induced charge accumulation in...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

An electron microscopy sample support comprises: a support member; and a metal foil comprising a porous region. The support member is configured to give structural stability to the metal foil, and theporous region of the metal foil is configured to receive an electron microscopy sample. Also provided is a method of manufacturing such an electron microscopy sample support, a method of imaging using such an electron microscopy sample support and an apparatus operable to perform such imaging. An electron microscopy specimen support in accordance with aspects and embodiments may reduce particle motion and / or sample charging in electron microscopy, thus improving information content available from electron micrographs. Appropriately designed and constructed supports may lead to an increased resolution per particle and increased accuracy of angular assignments in 3D reconstructions of for example, biological specimens. This may enable the determination of structures of smaller and more difficult proteins than was previously possible using EM techniques.

Description

[0001] This application is a branch of the invention application with the application date of August 12, 2014, the international application number of PCT / GB2014 / 052454, the Chinese national phase application number of 201480049902.2, and the invention title of "Electron Microscope Sample Holder Including Porous Metal Foil". case application. technical field [0002] The present invention relates to an electron microscope sample holder; a method of manufacturing such an electron microscope sample holder; a method of imaging using such an electron microscope sample holder and an apparatus operable to perform such an imaging method. Background technique [0003] Electron microscopy techniques can be used to image the sample. According to such techniques, a beam of electrons is used to "irradiate" the sample. The presence of the sample in the electron beam causes a change in the electron beam. Changes in the electron beam caused by the sample can be examined to produce a magn...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H01J37/20
CPCH01J2237/2001H01J2237/2004H01J2237/26H01J37/20H01J37/06H01J37/26
Inventor 洛里·帕斯莫尔克里斯托弗·拉索
Owner 英国研究与创新署
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com