174 results about "Electron microscopic" patented technology

The invention relates to a formula and method for immobilizing a tick sample for scanning electron microscopy, which belongs to the technical field of methods for immobilizing samples for scanning electron microscopy. The immobilization formula comprises a PBS buffer solution, polysorbate and glutaraldehyde, and a glutaraldehyde immobilization liquid is prepared from the above-mentioned components. The method comprises the following steps: (1) observing whether host tissue is left in basis capituli of the tick sample and if so, removing the host tissue; (2) cleaning the surface of the tick sample; (3) immobilizing the tick sample at room temperature by using the glutaraldehyde immobilization liquid; (4) carrying out gradient dehydration with ethanol on the immobilized tick sample; (5) putting the tick sample into mixed liquor of absolute ethyl alcohol and acetone for displacement, and then putting the tick sample into acetone for displacement; and (6) drying the tick sample in a vacuum freeze drying instrument for drying and spraying gold on the tick sample. During scanning electron microscopic observation, the phenomenon of fuzzy and foggy images or incapable imaging due to ionization discharging of the sample as water vapor produced after electron beam bombardment of the sample encounters high-energy electron streams is prevented.

A miniature pump has at least one controllable expansion-and-contraction chamber, and associated pair of tiny ducts interconnecting a fluid source and destination. The ducts communicate with the chamber(s); an linking tunnel links the ducts. Valves interact with fluid pressures due to expansion and contraction, imposing directionality on flow in the ducts and tunnel. Preferences: making the valve a passive flapper, implanting the pump in a creature, making the source a medication reservoir for supplying the creature; making the source a fuel tank and destination a tiny engine; making the source provide a specimen for assay and destination an observation slide; human or automatic examination of the slide under a microscope (e. g. electron microscope); making the source a reagent and destination a process stream; making the source a colorant and destination a colorant application system. Preferably included is an optical channel with intersecting fluid duct for optically monitoring pumped fluid.

The invention discloses a method for representing an amorphous alloy microstructure. An electron microscopy three-dimensional reconstruction technology is adopted, the method comprises the steps of performing sample production, transmitting observation records of an electron microscopic image under different angles and compositing a three-dimensional image through a series of two-dimensional images in turn, and the microstructure characteristics of amorphous alloy is represented. According to the method for representing the amorphous alloy microstructure, the difficulty is low, the cost is low, the repeatability is high, the technology is reliable, the three-dimensional structure information is obtained, and the microstructure is regulated and controlled through optimization on rapid solidification technology process parameters on the basis of the representation technology and accordingly the amorphous alloy which is excellent in soft magnetic property and mechanical property can be obtained.

The invention discloses a method for producing sintered plate corundum by using ultra- high temperature shaft furnace. It employs low- sodium high- purity pre-sintered aluminum oxide powder Al2O3>98.5% as raw material, grinding, ball forming and drying; feeding ball material into high- temperature shaft furnace and calcining at 1850- 1920 Deg. C, keeping temperature for 1- 1.5 hours, ventilating and cooling for two times to make the temperature of ball material at discharge port be reduced to 80 Deg. C, disintegrating sintered ball material, sifting and getting final product. The invention is characterized in that the crystal size of plate corundum is 20- 200 um, activity is high, and the product quality are very good: density (g/ cm3): 3.58- 3.62, porosity(%) is less than 5, water absorption rate (%) is less than 1.5; and the electron microscopic structure is: crystal size is 0- 200 um, and the crystal is equipped with close pores less than 10 um, and the crystal structure is compact.

A positive electrode active material for a nonaqueous electrolyte secondary battery includes particles of a lithium-transition metal composite oxide that contains nickel in the composition thereof and has a layered structure. The particles have an average particle size D_SEM based on electron microscopic observation in a range of 1 μm to 7 μm in which a ratio D₅₀/D_SEM of a 50% particle size D₅₀ in volume-based cumulative particle size distribution to the average particle size based on electron microscopic observation is in a range of 1 to 4, and a ratio D₉₀/D₁₀ of a 90% particle size D₉₀ to a 10% particle size D₁₀ in volume-based cumulative particle size distribution is 4 or less.

The invention discloses a method for searching a blind ore deposit by utilizing nanometer particles in an organism. The method comprises the steps of sampling, treatment and analysis of organism samples and judgment of analysis results, namely whether a to-be-tested area has the blind ore deposit is judged according to the characteristics of the analyzed particles, and ore elements are further predicted, wherein the sampling comprises getting animal and plant tissue samples in the to-be-tested area and storing in a fixing solution; the treatment comprises successfully attaching the animal and plant samples to a transmission electroscope carrying screen directly applied to a test on the premise of not damaging the samples; the analysis comprises detecting and analyzing the nanometer particles in the organism tissues on the carrying screen by adopting a transmission electron microscope. According to the method disclosed by the invention, by detecting and analyzing the nanometer particles in the organism tissues, whether a deep blind ore deposit exists or not can be accurately indicated, and the characteristics of the ore elements of a deep ore can be reflected directly. By utilizing the method in combination with the application of other physical and chemical survey techniques, the success rate for searching the ores can be effectively increased and the cost can be lowered as well.

The invention discloses a nickel-titanium amorphous alloy grid supporting film for a transmission electron microscope and a preparation method of the nickel-titanium amorphous alloy grid supporting film. A conductive film used is a nickel-titanium alloy nanometer film; the nickel-titanium alloy is shape memory alloy which is high in elasticity and mechanical strength, serves as a good conductor for power and heat and can be widely applied to medical apparatuses and instruments. The nickel-titanium alloy is in a large-scale industry at present and is the alloy material easily obtained. The grid supporting film is prepared from the nickel-titanium alloy material, and thus the superelasticity, the high mechanical strength and the outstanding conductivity of the shape memory alloy can be fully utilized to problems of low mechanical strength and serious electric charge of a carbon supporting film can be solved.

The invention belongs to the field of cytobiology and specifically relates to an in vitro three-dimensional culture model for research on vasculogenic mimicry of glioma stem cells and an application thereof. Preparation of the in vitro three-dimensional culture model comprises the following steps: immersing a three-dimensional collagen scaffold in a DMEM culture medium for 6-24 h, taking out the three-dimensional collagen scaffold, removing superfluous DMEM adhered to the three-dimensional collagen scaffold to obtain a pretreated three-dimensional collagen scaffold, placing the pretreated three-dimensional collagen scaffold on a cell culture plate, culturing sphere-formed glioma stem cells in the pretreated three-dimensional collagen scaffold, standing at 37 DEG C for 2-6 h, adding an endothelial medium, and culturing at 37 DEG C for 2-4 days, so as to obtain the in vitro three-dimensional culture model for research on vasculogenic mimicry of glioma stem cells. Each operational process of the in vitro three-dimensional culture model is carried out at room temperature; various kinds of in situ staining, such as immunohistochemical staining and immunofluorescent staining, can be carried out; electron microscopic examination can be carried out; and RT-PCR and Western Blot detection can be carried out directly after digestion.

The invention discloses a bdellovibrio bacteriovorus bacterial strain for eliminating listeria monocytogenes and an application thereof. The invention obtains bdellovibrio bacteriovorus BDSM08 by separation, purification and ultraviolet mutation. BDSM08 is in the arc-shaped unicellular form when observed by an electron microscope, the size thereof is 1.8*1.0 mu m, the ends thereof are provided with flagellum and the length of the flagellum is 3.2 mu m. The bdellovibrio bacteriovorus BDSM08 is cultivated with the two layer plating method at the temperature of 28 DEG C for three days to form transparent round negativecolony the diameter of which is 2-3mm and the optimum growing pH value of which is 7.2, the optimum growing temperature of which is 28 DEG C and the optimum salinity of which is0%. The microbial agent prepared by BDSM08 has a strong effect on killing listeria monocytogenes which can be commonly seen in environment. The invention applies the bdellovibrio bacteriovorus BDSM08for the first time to prevent and cure food listerellosis; the invention has a favourable effect on eliminating listeria monocytogenes on food, has characteristics of no toxicity, no side effect on food and the like, and has favourable application prospect.

The present invention discloses a method for analyzing the pore structure of the organic matter in the Lower Paleozoic shale. The method comprises the following steps: performing optical scale and two-dimensional scanning electron microscopic observation, performing three-dimensional cutting reconstruction by selecting typical organic matters, and performing detailed observation and image acquisition on the pore structure of the target organic matter; and using image analysis software to quantitatively characterize the characteristic parameters such as the face rate, the pore size distribution, the porosity and the like of different organic matters. According to the method provided by the present invention, the pore morphology of the organic matter of the Lower Paleozoic shale can be accurately and reliably analyzed, so that the problem of quantitative analysis on the pore structure of the organic matter can be solved; and the method has important guiding significance for the study onthe pore structure of the organic matter in the Lower Paleozoic shale, and provides a better reference for the study of the organic matter in the Lower Paleozoic shale and the exploitation of the Lower Paleozoic shale gas.

The invention provides a preparation method of a transmission electron microscopic sample. The method comprises the following steps: providing a sample with length, width and thickness, wherein the sample has an observation target, and the observation target includes at least one elongation structure along a thickness direction or a multilayer stack structure; marking the surface of the sample defined in the length and width directions, wherein a distance from the marked position to the observation target is in a preset distance ring; grinding the sample along a direction vertical to the thickness direction to the marked position; arranging the sample on a supporting desk, and allowing the grinding surface of the sample to depart from the supporting desk and the opposite surface of the grinding surface to face the supporting desk; forming a conductive film on the back of the sample in order to electrically connect the sample with the supporting desk; and processing the grinding surface by using focused ion beam to obtain the observation sample containing the observation target. The method improves the preparation efficiency, improves the hit rate, and avoids the problem of imaging blurring or image drift induced by charge accumulation in the sample preparation process.

An electrolytic thickness reducer is composed of DC power, electrolytic device of magnetic agitation and double spray and illumination device. It is featured as using 0-36 V span for DC power, placing a p-m pole in double spray component set in outer organic box with electrolyte, using stainless steel sheet as negative pole, placing positive sample in between two nozzles, having electron microscopic sample conducted with phi 0.3 mm Pt wire and stainless steel bar and having parallel light conducted out by all reflecting cable.

When injection of electrons into a sample supporting member causes a potential gradient between an insulative thin film and a conductive thin film at a site of electron beam injection, the potential barrier of the surface of the insulative thin film becomes thin, and an electron emission phenomenon is caused by tunnel effects. Secondary electrons caused in the insulative thin film tunnel to the conductive thin film along the potential gradient. The secondary electrons, having tunneled, reach a sample while diffusing in the conductive thin film. In the case where the sample is a sample with a high electron transmittance, such as a biological sample, the secondary electrons also tunnel through the interior of the sample. The secondary electrons are detected to acquire an SEM image in which the inner structure of the sample is reflected.

The invention relates to a method for observing in a plant blade microstructure in an oriented manner by treating a blade by utilizing a large-precise instrument-transmission electron microscope. The method is characterized in that a blade section structure chart correlated to a transverse slice is drawn by using a new process, the positioning of the transverse slice in a tissue structure and a spatial structure of the blade is realized, and the complete set of precise positioning structure chart of the blade with a complicated microstructure or the precise positioning structure chart of a certain specific part can be guaranteed and obtained by using a set of spatial positioning rules; and a microcosmic stereostructure can be established by combining the blade section structure with a transverse orderly positioning structure. The invention aims at providing a brand new sample treating, slicing, positioning and observing method utilizing the transmission electron microscope to observer the blade structure as the transverse slice is taken as a basis, and according to method, the operation is simple, the precise positioning research can be carried out on all the microstructures of the blade; and simultaneously, the true microcosmic stereostructure of the blade is detected by the orderly positioning structure.

The invention discloses an electron microscopic imaging system and an imaging method, and belongs to the field of electron imaging. The electron microscopic imaging system comprises a plurality of charged particle sources, wherein the charged particle sources are used for emitting charged particles; a convergence unit located under the charged particle sources; a diffraction unit located under theconvergence unit, a sample being arranged between the diffraction unit and the convergence unit; and a detector located under the diffraction unit. According to the method, the plurality of charged particle sources emit charged particles to form a plurality of charged particle beams; the plurality of charged particle beams pass through the convergence unit to form a charged particle beam probe; the charged particle beam probe penetrates through the sample and forms a diffraction pattern of the sample through the diffraction unit; and the detector receives the diffraction pattern and performsstacked imaging to reconstruct a sample image. The system aims to overcome the defects that when a single electron beam is used as an electron beam probe, the imaging quality is reduced and the data acquisition efficiency is reduced due to frequent movement; and the data acquisition efficiency and the imaging quality can be improved.

The present invention belongs to the scanning electron microscopic measurement technology field, and discloses a measurement method of the electron microscopic image line width and roughness. The method comprises the steps of obtaining a scanning electron microscopic image of a to-be-measured line structure; intercepting a first area; processing averagely along a line direction, and obtaining a line edge pixel distribution curve; according to the line edge pixel distribution curve, determining a first boundary area; analyzing the local pixels, and obtaining the boundary distribution; according to the boundary distribution, calculating the width and the roughness of a to-be-measured line, and extracting the width and roughness numerical values of the to-be-measured line. The measurement method of the present invention solves the problems in the prior art that the workload of measuring the line width and roughness is larger, a measurement error caused by the human intervention exists, and a limited number of data points only can be analyzed, and realizes the technical effects of improving the measurement accuracy and reliability, saving the actual measurement time and cost of the engineers.

Disclosed is a pellicle having a mask adhesive layer having appropriate softness, having a small adhesive residue after being peeled off from a mask, and having good handling characteristics; and a pellicle for preventing position deviation of patterns, in particular in double patterning. The pellicle of the present invention includes a pellicle frame, a pellicle membrane disposed on one end surface of the pellicle frame, and a mask adhesive layer disposed on other end surface of the pellicle frame; wherein the mask adhesive layer includes 35 to 170 weight parts of a hardness adjuster (B) containing a polypropylene (b1) and a propylene based elastomer (b2) per 100 weight parts of a styrene resin (A); and in an electron microscopic photograph of the mask adhesive layer, a phase-separated structure of a continuous phase of the styrene resin (A) and a discontinuous phase of the hardness adjuster (B) is observed.

The invention discloses a scanning electron microscopic imaging method, and belongs to the technical field of microscopic imaging. The scanning electron microscopic imaging method comprises the stepsof scanning the target object under the diaphragms with different convergence angles by using a scanning electron microscope to obtain a diffraction pattern; and mixing the diffraction patterns corresponding to the diaphragms to obtain a mixed diffraction pattern, performing multiple iterative calculations according to the mixed diffraction pattern to reconstruct O (r), taking the Oz (r) reconstructed by final iterative calculations as a final complex amplitude distribution function of the target object, and obtaining a reconstructed target object image according to the amplitude and phase ofthe Oz (r). The method aims to overcome the defects in the prior art. In order to overcome the defect that a diffraction pattern generated by a single diaphragm in a stacked imaging method can only obtain a reconstructed image of part of frequency band information of a target object, the invention provides a scanning electron microscopic imaging method which can obtain high-frequency characteristics and low-frequency characteristics of the target object, so that a clear and complete target object image can be obtained.

A glove is disclosed which includes a porous coating layer provided on the surface of a glove made of a fiber, wherein a plurality of pores having an area of 0.785 to 78.5 μm² are present, and an average of the smallest thickness of each resin layer existing between the pores for the respective pores is 0.9 to 178 μm in an electron-microscopic field at the time when a finger pad central portion, 40 mm away from a finger tip toward a finger pad, of a finger portion in the porous coating layer is cut off and a cross-section of 253 μm in length directed from the finger tip toward the finger pad and 2.5 to 10 μm in depth from a surface of the porous coating layer is observed at a magnification of 500 times with an electron microscope. The glove of the present invention is superior in abrasion resistance and peel strength, has excellent resistance to peeling/migration to pressure-sensitive adhesive tapes, and is superior in moisture permeability and flexibility.

The invention discloses an extraction method of exosomes. The method mainly comprises the operation steps: passing serum/plasma (a sodium citrate blood collection tube) through an LDLR affinity chromatography column, and enriching and concentrating the collected liquid with oxide. According to the invention, LDLR affinity chromatography is adopted to remove low-density lipoprotein in serum/plasma, and oxide is adopted to concentrate a collected buffer solution, so that a method for purifying exosome from serum is established. According to the invention, particle number is detected through nanoflow, exosome surface markers are detected through western blot, the transmission electron microscope detection results show that yield of the extracted exosome is high, the extracted exosome is further combined with a splitting method to release the internal substances of the exosome, and nucleic acid and protein can be subjected to the subsequent research. The method has advantages of simple operation steps, short extraction time, high purity of prepared exosomes, suitability for small samples and high cost performance, and is suitable for popularization and application in the field of in vitro diagnosis.

The invention relates to a pseudo soldering examining and judging method for BGA and CSP type chip spherical welding spots. The examining method comprises steps of: preparing an X-ray fluoroscopic examination device with an inclination irradiation function; opening a device door and putting a to-be-examined circuit board on a device carrier table; opening a ray generation device and moving a to-be-examined part to the ray; setting the device parameters as follows: the tube voltage to be 90KV; the tube current to be 110[mu]A; the filter to be high pass filter 1; the gamma value to be kept unchanged as 1; the brightness to be 3296; the contrast ratio to be 1447; and the angle of inclination to be adjusted to be 30 degrees; after the target is found, adjusting the magnification times to be the maximum; and under the inclined X-ray radiation, differentiating an upper-lower welding disc imaging profile and a welding ball body imaging profile. According to the invention, irreversible destructiveness caused by cross-section and electron microscopic energy spectrum methods is avoided; a pseudo soldering function of nondestructive examination for BGA and CSP type chip spherical welding spots is added; the pseudo soldering examining and judging method is simple to operate; and the judgment accuracy is high.