180 results about "Electron microscopic" patented technology

The invention discloses a method for representing an amorphous alloy microstructure. An electron microscopy three-dimensional reconstruction technology is adopted, the method comprises the steps of performing sample production, transmitting observation records of an electron microscopic image under different angles and compositing a three-dimensional image through a series of two-dimensional images in turn, and the microstructure characteristics of amorphous alloy is represented. According to the method for representing the amorphous alloy microstructure, the difficulty is low, the cost is low, the repeatability is high, the technology is reliable, the three-dimensional structure information is obtained, and the microstructure is regulated and controlled through optimization on rapid solidification technology process parameters on the basis of the representation technology and accordingly the amorphous alloy which is excellent in soft magnetic property and mechanical property can be obtained.

The invention discloses a scanning electron microscopic imaging method, and belongs to the technical field of microscopic imaging. The scanning electron microscopic imaging method comprises the stepsof scanning the target object under the diaphragms with different convergence angles by using a scanning electron microscope to obtain a diffraction pattern; and mixing the diffraction patterns corresponding to the diaphragms to obtain a mixed diffraction pattern, performing multiple iterative calculations according to the mixed diffraction pattern to reconstruct O (r), taking the Oz (r) reconstructed by final iterative calculations as a final complex amplitude distribution function of the target object, and obtaining a reconstructed target object image according to the amplitude and phase ofthe Oz (r). The method aims to overcome the defects in the prior art. In order to overcome the defect that a diffraction pattern generated by a single diaphragm in a stacked imaging method can only obtain a reconstructed image of part of frequency band information of a target object, the invention provides a scanning electron microscopic imaging method which can obtain high-frequency characteristics and low-frequency characteristics of the target object, so that a clear and complete target object image can be obtained.