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Method for representing amorphous alloy microstructure

A technology of microstructure and characterization, which is applied in the field of microstructure characterization and characterization of the microstructure of amorphous alloys, can solve the problems of lack of effective technical methods and the inability to characterize the three-dimensional structural characteristics of amorphous alloy atomic clusters, etc., and achieve reliable technology and excellent softness. Magnetic properties and mechanical properties, repeatable effect

Active Publication Date: 2015-08-26
ADVANCED TECHNOLOGY & MATERIALS CO LTD
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the image obtained by this technology is a two-dimensional diffraction image of atomic clusters, and it is not yet possible to characterize the three-dimensional structural characteristics of amorphous alloy atomic clusters.
[0010] In summary, how to characterize the three-dimensio

Method used

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  • Method for representing amorphous alloy microstructure
  • Method for representing amorphous alloy microstructure
  • Method for representing amorphous alloy microstructure

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Experimental program
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preparation example Construction

[0034] In the preparation step of the sample, the amorphous material is successively subjected to wire cutting, acetone ultrasonic treatment, ultrasonic cutting into discs, bonding sample holder, heat curing, flat grinding, pitting (ie mechanical thinning), ion beam Thinning, and finally the desired sample is prepared.

[0035] The thickness of the sample is 0.5-500nm (such as 0.6nm, 5nm, 10nm, 50nm, 70nm, 100nm, 150nm, 200nm, 260nm, 300nm, 350nm, 400nm, 450nm, 490nm), preferably, the thickness of the sample The size is 6-100 nm (such as 7 nm, 10 nm, 15 nm, 25 nm, 40 nm, 50 nm, 60 nm, 70 nm, 80 nm, 90 nm). The method of the present invention can characterize samples with a thickness exceeding 6 nm. The sample thickness range of the present invention is much wider than the current high-cost Angstrom-scale electron beam method, which usually requires samples below 5nm.

[0036] Preferably, the thickness of the sheet after wire cutting is not greater than 0.5mm (such as 0.1mm, ...

Embodiment 1

[0050] Using Zr 48 Cu 45 Al 7 (The subscript number is at%) amorphous alloy. The amorphous alloy is prepared by a common copper mold casting method in the field.

[0051] The method for characterizing the above amorphous alloys is as follows:

[0052] Step 1: including the following sub-steps in turn: (1) cutting the amorphous alloy material into thin slices with a thickness of 0.2 mm using a wire cutting machine (South Bay Technology inc. model: 650); (2) placing the thin slices in acetone for ultrasonication Treat for 20min; (3) Cut the thin slices after the ultrasonic treatment of acetone into discs with an ultrasonic cutting machine (Gatan model: 601), and the specifications are (4) Bond the wafer to the sample holder; (5) Place the wafer with the bracket in a heating furnace for heating and curing, the heating temperature is 70°C, and the heating time is 15 minutes; (6) The cured wafer is (7) Use a pit instrument (GATAN 656 type) to mechanically thin the polished waf...

Embodiment 2

[0057] Using Fe 80 Si 9 B 11 (the subscript number is at%) amorphous alloy, which is prepared by the rapid solidification method commonly used in this field.

[0058] Step 1: including the following sub-steps in turn: (1) cutting the amorphous alloy material into 0.3mm thin slices with a wire cutting machine (South Bay Technology inc. model: 650); (2) placing the thin slices in acetone for ultrasonication Treat for 20min; (3) Cut the thin slices after the ultrasonic treatment of acetone into discs with an ultrasonic cutting machine (Gatan model: 601), and the specifications are (4) Bond the wafer to the sample holder; (5) Place the wafer with the bracket in a heating furnace for heating and curing, the heating temperature is 70°C, and the heating time is 15 minutes; (6) The cured wafer is (7) Use a pit instrument (GATAN 656 type) to mechanically thin the polished wafer so that the center of the sample is as thin as 8 μm; (8) Use an ion thinner (GATAN model: 691) to The io...

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Abstract

The invention discloses a method for representing an amorphous alloy microstructure. An electron microscopy three-dimensional reconstruction technology is adopted, the method comprises the steps of performing sample production, transmitting observation records of an electron microscopic image under different angles and compositing a three-dimensional image through a series of two-dimensional images in turn, and the microstructure characteristics of amorphous alloy is represented. According to the method for representing the amorphous alloy microstructure, the difficulty is low, the cost is low, the repeatability is high, the technology is reliable, the three-dimensional structure information is obtained, and the microstructure is regulated and controlled through optimization on rapid solidification technology process parameters on the basis of the representation technology and accordingly the amorphous alloy which is excellent in soft magnetic property and mechanical property can be obtained.

Description

technical field [0001] The present invention relates to a microstructure characterization method, in particular to a method for characterization of the microstructure of amorphous alloys. The microstructure obtained by the method can provide information on the distribution and connection of atomic clusters in amorphous alloys, and belongs to the structure of amorphous alloy materials. Characterize technical fields. Background technique [0002] The research results of the last ten years point out that amorphous alloys are densely packed by atomic clusters, and the clusters can share points, lines, and surfaces to connect with each other, thus forming a three-dimensional network structure. The performance design, optimization, and control technologies of amorphous alloys are all based on the short-program structure in amorphous alloys, that is, atomic clusters. Atomic clusters in amorphous alloys are the most basic structural units that determine the macroscopic properties o...

Claims

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Application Information

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IPC IPC(8): G01N23/22G01N1/28
Inventor 周少雄王岩国董帮少向睿张广强李宗臻高慧
Owner ADVANCED TECHNOLOGY & MATERIALS CO LTD
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