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Method for observing in a plant blade microstructure in an oriented manner by treating blade

A technology of microstructure and plant leaves, applied in the direction of material analysis by measuring secondary emissions, preparation of test samples, sampling devices, etc., can solve problems such as inability to study

Active Publication Date: 2013-03-13
SHENYANG AGRI UNIV
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Problems solved by technology

[0009] 3. Unable to study unfamiliar, complex, and similar structures in different organizational structures at multiple levels

Method used

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  • Method for observing in a plant blade microstructure in an oriented manner by treating blade
  • Method for observing in a plant blade microstructure in an oriented manner by treating blade
  • Method for observing in a plant blade microstructure in an oriented manner by treating blade

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Embodiment Construction

[0147] The present invention organically combines the method for observing leaf cross-section slices with a transmission electron microscope, the method for observing leaf transverse slices with a transmission electron microscope, and the method for observing secondary electron images with a scanning electron microscope, and provides a method for positioning research in the microstructure of plant leaves. As for the method of processing leaves, the present invention can obtain a set of precisely positioned tissue, cell, and organelle structure diagrams; it can also conduct research on the precise positioning of specific parts of leaves with complex structures in a simple and convenient manner.

[0148] The specific method mainly includes the following eight parts: ①The pretreatment part of the transmission leaf sample, ②The part of making the overall cross-sectional structure diagram for positioning, ③The part of making the transverse slice, ④The vertical space and tissue struct...

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Abstract

The invention relates to a method for observing in a plant blade microstructure in an oriented manner by treating a blade by utilizing a large-precise instrument-transmission electron microscope. The method is characterized in that a blade section structure chart correlated to a transverse slice is drawn by using a new process, the positioning of the transverse slice in a tissue structure and a spatial structure of the blade is realized, and the complete set of precise positioning structure chart of the blade with a complicated microstructure or the precise positioning structure chart of a certain specific part can be guaranteed and obtained by using a set of spatial positioning rules; and a microcosmic stereostructure can be established by combining the blade section structure with a transverse orderly positioning structure. The invention aims at providing a brand new sample treating, slicing, positioning and observing method utilizing the transmission electron microscope to observer the blade structure as the transverse slice is taken as a basis, and according to method, the operation is simple, the precise positioning research can be carried out on all the microstructures of the blade; and simultaneously, the true microcosmic stereostructure of the blade is detected by the orderly positioning structure.

Description

technical field [0001] The invention relates to a method for treating leaves by using a transmission electron microscope, a large-scale precision instrument, to conduct positioning research in the microcosmic and ultramicroscopic structures of plant leaves. Background technique [0002] Leaf is an important organ of plants. In plant research, the research on plant leaves occupies a considerable proportion. [0003] The use of transmission electron microscopy to study the micro- and ultra-microstructure of leaves has been going on for decades, but the research method has been stagnant in section direction slicing. Due to the messy information obtained by slicing in the section direction, little progress has been made in the study of leaf structure until 2008 "A method for processing leaves for the study of holographic structure of plant leaves" in 2011 adopted horizontal slices of leaves to obtain a comprehensive and systematic method of obtaining a large amount of leaf micro...

Claims

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Application Information

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IPC IPC(8): G01N1/28G01N1/06G01N1/36G01N23/22
Inventor 李天来陈伟之
Owner SHENYANG AGRI UNIV
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