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Method and device for measuring contact resistance between different media

A technology of contact resistance and medium, which is applied in the direction of measuring devices, measuring resistance/reactance/impedance, measuring electrical variables, etc., can solve the problem that the contact resistance cannot be directly measured, and achieve the effect of high accuracy, simple operation and easy operation

Inactive Publication Date: 2019-07-12
INSPUR SUZHOU INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Since there is no entity in the contact resistance, we cannot directly measure the contact resistance when we use general measurement methods, such as using a multimeter to measure the resistance. We can only measure the total resistance of the two media, including the contact resistance and the volume of the two media. resistance

Method used

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  • Method and device for measuring contact resistance between different media
  • Method and device for measuring contact resistance between different media
  • Method and device for measuring contact resistance between different media

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Embodiment Construction

[0020] In order to make the object, technical solution and advantages of the present invention clearer, the embodiments of the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0021] It should be noted that all expressions using "first" and "second" in the embodiments of the present invention are to distinguish two entities with the same name but different parameters or parameters that are not the same, see "first" and "second" It is only for the convenience of expression, and should not be construed as a limitation on the embodiments of the present invention, which will not be described one by one in the subsequent embodiments.

[0022] Based on the above purpose, the first aspect of the embodiments of the present invention proposes an embodiment of a method for measuring contact resistance between different media. figure 1 Shown is a schematic flowchart of an embodiment of ...

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Abstract

The invention discloses a method for measuring contact resistance between different media, which comprises the following steps of: attaching a first medium and a second medium together, and measuringthe total resistance of the first medium and the second medium; keeping the first medium unchanged, changing the thickness of the second medium for multiple times, and respectively measuring the totalresistance each time; and performing linear fitting on the plurality of measured total resistances, and determining the contact resistance of the first medium and the second medium through a curve obtained by fitting. The invention also discloses computer equipment for measuring the contact resistance between different media and a computer readable storage medium. According to the method and thedevice for measuring the contact resistance between different media provided by the invention, the contact resistance can be very simply and conveniently measured, and the precision is relatively high.

Description

technical field [0001] The present invention relates to the field of circuit measurement, more specifically, to a method and device for measuring contact resistance between different media. Background technique [0002] When two media are in contact, contact resistance will be generated on the contact surface. In general circuits, the contact resistance is required to be below 10-20mohm, and some switches are required to be below 100-500uohm. Some circuits are sensitive to changes in contact resistance. The existence of contact resistance will have an adverse effect on the circuit, especially the logic signal of the digital circuit. Therefore, how to accurately measure the contact resistance between different media is particularly important. [0003] Since there is no entity in the contact resistance, we cannot directly measure the contact resistance when we use general measurement methods, such as using a multimeter to measure the resistance. We can only measure the tota...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R27/02
CPCG01R27/02
Inventor 孙豪
Owner INSPUR SUZHOU INTELLIGENT TECH CO LTD