Signal debugging method of storage system

Abstract

The invention relates to the technical field of storage systems, in particular to a signal debugging method of the storage system, and the method is applied to the storage system, the storage system comprises a controller and a memory, and the signal debugging method comprises the following steps of S1, after the storage system is started, adopting a test module to carry out initial test on different data signals so as to obtain the initial value of each data signal; S2, according to the initial value of each data signal, manually setting a delay window of each data signal to obtain a maximumboundary value and a minimum boundary value of each data signal; S3, obtaining the optimal center value of each data signal according to the maximum boundary value and the minimum boundary value of each data signal; and S4, comparing the optimal center value of each data signal with the verification parameters of the test module so as to analyze the error of the test module. The method has the beneficial effects that by manually setting the delay window, whether the value of the test software is reasonable and whether an improved space exists can be effectively verified.

Description

technical field [0001] The invention relates to the technical field of storage systems, in particular to a signal debugging method of a storage system. Background technique [0002] Current consumer electronic products, especially smart electronic products, have more and more system operating speeds and functions. Code storage and application installation require a larger capacity EMMC (Embedded Multi Media Card, static memory). EMMC meets this demand It has been widely used in EMMC and has almost become a standard accessory of modern smart electronic products, but the access speed of EMMC has become the bottleneck of system performance, and due to cost considerations, some consumer electronics such as smart TVs also need to use two layers of PCB boards , so the impact on the EMMC signal becomes more and more obvious. In order to improve the EMMC access speed as much as possible and ensure the stable operation of the system, it is necessary to have a large enough writing and...

AI Technical Summary

Problems solved by technology

[0004] The current industry solution is to use a dedicated test module, such as figure 1 As shown, the principle of the delay unit T1 and the test module T2, such as the test module, is to scan the best data signal during the startup process, and then adjust the center position of the window of the data signal to the sampling point by setting the delay value, but The disadvantages of this method are: (1) The test time is short, so it is greatly affected by the fluctuation of the system power supply; (2) The test time is the light load when the power is turned on, which cannot effectively simulate the actual application environment; (3) Sometimes it is also affected by the algorithm The impact of the real effective window can not be seen; (4) can not self-evaluate whether it is the best window

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