Atomic layer etch process using plasma in conjunction with a rapid thermal activation process
A plasma and process technology, used in the field of alternative atomic layer etching, surface technology, equipment and systems for performing the process, layer technology, and etching carbon-containing films, which can solve the problem of low ion bombardment reactivity, Less control of etching cycles, high chemical reactivity, etc.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0017] Reference will now be made in detail to the embodiments, one or more examples of which are illustrated in the accompanying drawings. Each example is provided by way of explanation of the embodiment, not limitation of the present disclosure. In fact, it will be apparent to those skilled in the art that various modifications and changes can be made in the embodiments without departing from the scope or spirit of the present disclosure. For example, features illustrated or described as part of one embodiment can be used with another embodiment to yield a still further embodiment. Accordingly, it is intended that aspects of the present disclosure cover such modifications and variations.
[0018] The present disclosure generally relates to processes for etching the surface of a substrate, such as a semiconductor wafer. The present disclosure also relates to apparatus and systems for performing the process. According to the present disclosure, the surface of the substrate ...
PUM
| Property | Measurement | Unit |
|---|---|---|
| diameter | aaaaa | aaaaa |
| diameter | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
Login to View More 


