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Atomic layer etch process using plasma in conjunction with a rapid thermal activation process

A plasma and process technology, used in the field of alternative atomic layer etching, surface technology, equipment and systems for performing the process, layer technology, and etching carbon-containing films, which can solve the problem of low ion bombardment reactivity, Less control of etching cycles, high chemical reactivity, etc.

Active Publication Date: 2019-08-02
베이징이타운세미컨덕터테크놀로지컴퍼니리미티드 +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the traditional method described above using ion bombardment activation has not been successful on other layers, especially carbon-containing layers and other low-k dielectric films.
For example, these other materials are less reactive to ion bombardment and more reactive to chemical reactions
Additionally, in some embodiments, higher temperatures are required for the etch process to occur, which can result in very long etch cycles that provide less control over the process

Method used

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  • Atomic layer etch process using plasma in conjunction with a rapid thermal activation process
  • Atomic layer etch process using plasma in conjunction with a rapid thermal activation process
  • Atomic layer etch process using plasma in conjunction with a rapid thermal activation process

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Embodiment Construction

[0017] Reference will now be made in detail to the embodiments, one or more examples of which are illustrated in the accompanying drawings. Each example is provided by way of explanation of the embodiment, not limitation of the present disclosure. In fact, it will be apparent to those skilled in the art that various modifications and changes can be made in the embodiments without departing from the scope or spirit of the present disclosure. For example, features illustrated or described as part of one embodiment can be used with another embodiment to yield a still further embodiment. Accordingly, it is intended that aspects of the present disclosure cover such modifications and variations.

[0018] The present disclosure generally relates to processes for etching the surface of a substrate, such as a semiconductor wafer. The present disclosure also relates to apparatus and systems for performing the process. According to the present disclosure, the surface of the substrate ...

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Abstract

A process for etching a film layer on a semiconductor wafer is disclosed. The process is particularly well suited to etching carbon containing layers, such as hardmask layers, photoresist layers, andother low dielectric films. In accordance with the present disclosure, a reactive species generated from a plasma is contacted with a surface of the film layer. Simultaneously, the substrate or semiconductor wafer is subjected to rapid thermal heating cycles that increase the temperature past the activation temperature of the reaction in a controlled manner.

Description

[0001] related application [0002] This application is based on and claims priority to US Provisional Patent Application Serial No. 62 / 434,036, filed December 14, 2016, which is incorporated herein by reference. Background technique [0003] Plasma processing is widely used in the semiconductor industry for deposition, etching, resist removal, and related processing of semiconductor wafers and other substrates. Plasma sources (eg, microwave, ECR, induction, etc.) are commonly used in plasma processing to generate high density plasma and reactive species for processing substrates. [0004] One type of process that has been performed using plasma in the past is atomic layer etching. Atomic layer etching is a technique that performs critical etching with very high precision and is used in semiconductor device manufacturing. Atomic layer etching is performed on thin layers while attempting to avoid undue subsurface damage or undesired modification. Atomic layer etching can be ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/311
CPCH01L21/31138H01J37/32422H01J37/32357H01J37/32724H01L21/31058H01L21/3065H01J37/32449H01L21/324H01L21/027H01J2237/2001
Inventor 马绍铭
Owner 베이징이타운세미컨덕터테크놀로지컴퍼니리미티드