A method for fabricating a
semiconductor device includes sequentially stacking an
etching stop film, first mold layer, first supporter layer, second mold layer, second supporter layer, third mold layer, and third supporter layer on a substrate extending in a first direction and a second direction, perpendicular to the first direction, forming a lower
electrode which penetrates the
etching stop film, the first mold layer, the first supporter layer, the second mold layer, the second supporter layer, the third mold layer, and the third supporter layer, removing the first mold layer, the second mold layer and the third mold layer, forming a
dielectric film extending along the lower
electrode and the first to third supporter
layers, and forming an upper
electrode on the
dielectric film. The second mold layer includes a first film including no
nitrogen, and a second film, disposed on the first film, including
nitrogen.