Method for adjusting process parameters for a process for manufacturing
electronic assemblies by means of automated manufacturing on a
production line (100), comprising the method (A) Performing a correlation procedure to correlate different data sets that are assigned to one and the same
printed circuit board (470) on which an electronic
assembly with several electronic components is built up by means of automated manufacturing, the correlation procedure comprising Providing a first
data set from a first
machine (110), wherein the first
data set is assigned to the first
machine (110), controls an operation of the first
machine (110) and features: first position information and first characteristic information about characteristic target properties of a product characteristic structure of the
printed circuit board (470) at several positions of the
printed circuit board (470); Providing a second
data set from a second machine (160), wherein the second data set is assigned to the second machine (160), controls an operation of the second machine (160) and features: second position information and second characteristic information about characteristic target properties of the product characteristic structure of the printed circuit board (470) at the multiple positions of the printed circuit board (470); geometric
superimposition of the first position information with the second position information; Repositioning the first position information and / or the second position information such that the totality of distances between each pair of associated position information, i.e., a first position information and an associated second position information, from each of the same locations on the printed circuit board (470), is reduced; and Providing a third data set from a third machine (130), wherein the third data set is assigned to the third machine (130), controls an operation of the third machine (130) and has third position information and third characteristic information about characteristic target properties of the product characteristic structure of the printed circuit board (470) at the multiple positions of the printed circuit board (470); wherein the geometric
overlay further comprises a geometric
overlay of the third position information with the first position information and / or the second position information; and wherein the repositioning further comprises repositioning the third position information such that an entirety of the sum of the three distances between each set of three mutually associated position information, i.e. the sum of (i) a first distance between the first position information and the associated second position information, (ii) a second distance between the associated second position information and a third position information which is associated with the first position information and the second position information, and (iii) a third distance between the third position information and the first position information, from each of the same location on the printed circuit board (470), is reduced; wherein the first machine is a first
processing machine (110) and the first data
record contains a first process data
record; wherein the second machine is a first inspection machine (160) and the second data set contains a first inspection data set; wherein the third machine is a second
processing machine (130) and the third data set contains a second process data set; and wherein the method for adjusting process parameters further comprises (B) Determine, using the first inspection machine (160), a first deviation between an actual property and a target property of the product characteristic structure in a first area of the printed circuit board (470), which is assigned to a first location on a surface of the printed circuit board (470); (C) Creating a first combination data set (375) based on (i) at least one first part of each of the first process data set, the second process data set and the first inspection data set, wherein the first part is assigned to the first area of the printed circuit board (470) and further based on (ii) the repositioned first position information and / or the repositioned second position information and / or the repositioned third position information; and (D) Adjusting first process parameters of the first
processing machine (110) and / or second process parameters of the second processing machine (130) based on the created first combination data set (375) and the determined first deviation.