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Calculation method for optimizing bias condition in power supply scanning parameter test

A technology of scanning parameters and bias conditions, which is applied in the calculation field of bias conditions in the optimization of power supply scanning parameter tests, can solve the problems of low efficiency of parameter testing, adaptive product state changes, and test bias conditions that cannot be changed, etc., to achieve adaptability Wide range of test products, high innovation and practical application significance, and the effect of improving test efficiency

Active Publication Date: 2019-10-15
NO 24 RES INST OF CETC
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, it is usually easy to cause problems such as low efficiency of parameter testing, test bias conditions cannot be changed once the test program is released, and adaptive product status changes.

Method used

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  • Calculation method for optimizing bias condition in power supply scanning parameter test
  • Calculation method for optimizing bias condition in power supply scanning parameter test
  • Calculation method for optimizing bias condition in power supply scanning parameter test

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Embodiment Construction

[0040] In order to make the purpose, technical solutions and advantages of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, and Not all examples.

[0041] Below in conjunction with accompanying drawing and embodiment the patent of the present invention is described in detail:

[0042] Such as figure 1 As shown, a calculation method for optimizing bias conditions in the power scan parameter test in the present invention includes the following steps:

[0043] Step 1. Extract the latest historical test data of several power scan parameter tests, and filter them for validity, so as to eliminate out-of-range data;

[0044] Step 2, grouping the filtered validity data, dividing the maximum and minimum values ​​in the data into several intervals a...

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Abstract

The invention belongs to the field of automatic testing, and relates to a calculation method for optimizing the bias condition in a power supply scanning parameter test. The method comprises the following steps: extracting a plurality of latest power supply scanning parameter test data, and removing out-of-range data; dividing the maximum value and the minimum value in the data into a plurality ofintervals at equal intervals; finding out a group with the maximum data volume, comparing the data coverage rate with a threshold value of the group, if the data coverage rate is smaller than the threshold value, expanding the leftward or rightward group, and taking the expanded group as the group with the maximum data volume; calculating a temporary bias range according to the grouping condition, expanding the two sides of the temporary bias range according to a fixed expansion value, and taking the expanded bias range as a test bias condition of the next power supply scanning parameter test. On the premise that existing power supply product scanning parameter testing hardware is not changed, new testing bias conditions are worked out according to historical testing result data, testingefficiency can be greatly improved, and the method is suitable for a wide testing product range.

Description

technical field [0001] The invention belongs to the field of automatic testing; in particular, it relates to a calculation method for optimizing bias conditions in power supply scanning parameter testing. Background technique [0002] In DC / DC and other power supply products, there are many products that need to test scanning parameters such as input undervoltage on or off voltage, input overvoltage on or off voltage, frequency synchronization range, output overvoltage protection point, output overcurrent protection point, etc. . When testing these parameters, the bias conditions are usually set according to the product data sheet or detailed specifications. For example, if the input overvoltage protection voltage index of a product is 4.8V-5.2V, the test bias conditions are generally set to 4.78V-5.22V. test. However, it is usually easy to produce problems such as low efficiency of parameter testing, test bias conditions cannot be changed once the test program is released...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/10G01R31/40
CPCG06F17/10G01R31/40
Inventor 李超崔庆林颜敏
Owner NO 24 RES INST OF CETC
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