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Light source device, surface defect detection method and device

A light source device and defect detection technology, which is applied in the direction of optical testing of defects/defects, measuring devices, and material analysis through optical means, which can solve the problems of leaving cameras, not easy to scratch, and background distinction

Active Publication Date: 2022-04-29
HANS LASER TECH IND GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] Based on this, it is necessary to provide a light source device, a surface defect detection method and a device for the problem that when the traditional light source provides light, it is difficult to distinguish the scratch from the background or leave the image of the camera.

Method used

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  • Light source device, surface defect detection method and device
  • Light source device, surface defect detection method and device
  • Light source device, surface defect detection method and device

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Embodiment Construction

[0037] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the associated drawings. A preferred embodiment of the invention is shown in the drawings. However, the present invention can be embodied in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided so that the disclosure of the present invention will be thorough and complete.

[0038] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the technical field of the invention. The terms used herein in the description of the present invention are for the purpose of describing specific embodiments only, and are not intended to limit the present invention. As used herein, the term "and / or" includes any and all combinations of one or more of the associated listed items.

[0039] In the...

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PUM

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Abstract

The invention relates to a light source device, a surface defect detection method and a device. The light source device includes: a bottom plate with a light outlet; a spherical shell with a hemispherical outline, which is buckled on the bottom plate and encloses with the bottom plate to form a hemispherical cavity; on the spherical shell opposite to the light outlet The position is provided with an observation window; the inner wall of the spherical shell is coated with a diffuse reflection coating; the light source is arranged at a predetermined position on the bottom plate to provide light; the light is diffusely reflected by the diffuse reflection coating and then emitted from the The mouth is emitted to the outside of the cavity to form uniform irradiation light; the reflection-transmission mirror is arranged in the cavity and is blocked between the light outlet and the observation window, so that the light on both sides of the reflection-transmission mirror is directed to the In the case of reflective-transmissive mirrors, part of the light is transmitted and part of the light is reflected. The above light source device, surface defect detection device and method can avoid seeing the image of the camera when performing defect detection, and the scratches on the surface of the object and the background can also be distinguished.

Description

technical field [0001] The invention relates to the technical field of machine vision light sources, in particular to a light source device, a method and a device for detecting surface defects. Background technique [0002] In the application of machine vision, the field of detection, especially defect detection, has always been a difficult research point. Among them, the detection of smooth specular objects is the most difficult point, and the main difficulty is focused on lighting. In the actual application process of machine vision, lighting is the first step in the operation, and it is also a very critical step, which often determines the complexity of the subsequent processing algorithm and the success or failure of the entire solution. [0003] At present, the processing level is getting more and more exquisite, more products have smooth surface and streamlined shape, and the demand for smooth specular reflection surface inspection is also increasing. Therefore, it i...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/88G01N21/01
CPCG01N21/88G01N21/01G01N2021/0112G01N2201/061
Inventor 王瑾曹锋吕文阁王维语覃海云伍星游佳明高云峰
Owner HANS LASER TECH IND GRP CO LTD
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