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A biaxial residual stress introduction device based on white light interferometry surface topography

A technology for measuring surface and residual stress, applied in measuring devices, force/torque/work measuring instruments, using stable tension/pressure to test the strength of materials, etc., can solve the problem of narrow operating space, inability to place observation objects, and white light interference instruments The operation space is narrow and other problems, to achieve the effect of simple operation

Active Publication Date: 2021-12-17
JIANGSU UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In order to overcome the problems of the narrow operating space on the white light interferometry instrument and the need for multiple sets of biaxial residual stress tests in different situations during the experiment, the present invention proposes a biaxial residual stress introduction device based on white light interferometry surface topography , can controllably apply any biaxial residual stress, and can use the white light interferometry instrument to observe the surface topography in situ under the premise of keeping the residual stress unloaded after the indentation is pressed in and unloaded, which overcomes the narrow operating space of the white light interferometry instrument , the problem of not being able to place larger observation objects

Method used

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  • A biaxial residual stress introduction device based on white light interferometry surface topography
  • A biaxial residual stress introduction device based on white light interferometry surface topography
  • A biaxial residual stress introduction device based on white light interferometry surface topography

Examples

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Embodiment

[0041] For the 2024 aluminum alloy material, equibiaxial residual stress (50MPa) and non-equal biaxial residual stress (100MPa, 50MPa) were applied respectively.

[0042] First, a cross-shaped specimen made of 2024 aluminum alloy was prepared, and the central area of ​​the specimen was carefully polished with 1000# sandpaper to ensure that the area to be observed of the specimen was smooth and flat with small roughness. Then, paste the resistance strain gauges in the two directions of the test piece close to the center point of the press-in point 5mm. After the strain gauge is pasted, place the specimen on the specimen positioning column of the lower fixture, connect the upper fixture and the lower fixture into a whole through the fixture fixing bolts, and then fix the specimen through the specimen fixing bolts on the upper fixture Live so that it does not move.

[0043] After fixing the test piece, slowly screw the loading contact platform from the threaded hole in the cente...

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Abstract

The invention discloses a biaxial residual stress introduction device based on white light interferometry surface topography, comprising: an upper clamp and a lower clamp, both of which are cross-shaped, and the upper clamp and the lower clamp are Detachable connection, a cross-shaped groove is opened in the middle of the surface of the lower fixture, and a plurality of test piece positioning columns are symmetrically distributed in the cross-shaped groove, and a test piece is placed on the top of the plurality of test piece positioning columns. The top surface of the positioning column of the test piece is in contact with the bottom surface of the test piece; the residual stress introduction device provided by the present invention can apply any two-way tensile stress and compressive stress, the operation is simple, and the value of the residual stress can be artificially controlled , and the application of residual stress does not necessarily cause damage to the specimen. After using the device to apply residual stress and perform indentation, the surface morphology can be observed with a white light interferometer under the premise of maintaining the residual stress without unloading.

Description

technical field [0001] The invention belongs to the technical field of experimental mechanical testing devices, and in particular relates to a biaxial residual stress introducing device based on white light interferometric measurement of surface topography. Background technique [0002] Materials such as ceramics, metals, and glasses are subjected to varying degrees of residual stress due to thermal mismatch or mechanical / thermal processing during fabrication, welding / joining, and sintering. For example, the heat generated when metal is welded may cause localized expansion of the metal, and when the weldment cools, these areas in the weldment cool and contract more than other areas, creating residual stresses. The existence of residual stress will affect the dimensional stability of material components, and it has an important impact on the safety of structures and the service life of engineering components. In addition, the existence of residual stress is unpredictable, so...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N3/08G01N3/04G01N3/02G01L5/00
CPCG01N3/08G01N3/02G01N3/04G01L5/0047G01N2203/0019G01N2203/0078G01N2203/0641G01N2203/0682
Inventor 朱建国钱文杰张慧颖李建
Owner JIANGSU UNIV