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A method for quickly judging the burn-through depth of metal paste without damage

A metal paste, non-destructive technology, used in material excitation analysis, semiconductor/solid-state device testing/measurement, electrical components, etc. problem, to achieve the effect of simple and convenient detection method

Active Publication Date: 2022-06-28
东方日升(江苏)新能源有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The above-mentioned invention patent application has the advantage of greatly reducing the burn-through depth of the metal paste, but it still does not provide a more convenient method for detecting the burn-through depth of the metal paste

Method used

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  • A method for quickly judging the burn-through depth of metal paste without damage
  • A method for quickly judging the burn-through depth of metal paste without damage
  • A method for quickly judging the burn-through depth of metal paste without damage

Examples

Experimental program
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Effect test

Embodiment 1

[0027] This embodiment provides a method for quickly judging the burn-through depth of metal slurry without damage, such as figure 1 shown, including the following steps:

[0028] Step 1: take the cleaned P-type silicon wafer as the substrate;

[0029] Step 2: Grow a passivation film on the surface of the substrate, the passivation film is AlO x / SiN x Double-layer passivation film, the total thickness of the passivation film is 200nm, and the sample to be treated is obtained;

[0030] Step 3: Coating the metal slurry on one side of the sample to be processed obtained in Step 2, and then sintering at a sintering temperature of 800° C. to obtain an experimental sample;

[0031] Step 4: Use the PL tester to collect the PL intensity values ​​of the metal paste area 1 and the non-metal paste area 2 of the experimental sample obtained in step 3 respectively, and obtain the average PL intensity value PL of the metal paste area 1 of the experimental sample 金属 and the average PL i...

Embodiment 2

[0037] This embodiment provides a method for quickly judging the burn-through depth of metal slurry without damage, such as figure 1 shown, including the following steps:

[0038] Step 1: take the cleaned N-type silicon wafer as the substrate;

[0039] Step 2: growing a passivation film on the surface of the substrate, the passivation film is a SiN passivation film, and the total thickness of the passivation film is 200 nm to obtain a sample to be processed;

[0040] Step 3: Coating the metal slurry on one side of the sample to be processed obtained in Step 2, and then sintering at a sintering temperature of 800° C. to obtain an experimental sample;

[0041] Step 4: Use the PL tester to collect the PL intensity values ​​of the metal paste area 1 and the non-metal paste area 2 of the experimental sample obtained in step 3 respectively, and obtain the average PL intensity value PL of the metal paste area 1 of the experimental sample 金属 and the average PL intensity value PL of ...

Embodiment 3

[0044] This embodiment provides a method for quickly judging the burn-through depth of metal slurry without damage, such as figure 1 shown, including the following steps:

[0045] Step 1: take the cleaned N-type silicon wafer as the substrate;

[0046] Step 2: Grow a passivation film on the surface of the substrate, the passivation film is SiO 2 / SiN double-layer passivation film, the total thickness of the passivation film is 200nm, and the sample to be treated is obtained;

[0047] Step 3: Coating the metal slurry on one side of the sample to be processed obtained in Step 2, and then sintering at a sintering temperature of 800° C. to obtain an experimental sample;

[0048] Step 4: Use the PL tester to collect the PL intensity values ​​of the metal paste area 1 and the non-metal paste area 2 of the experimental sample obtained in step 3 respectively, and obtain the average PL intensity value PL of the metal paste area 1 of the experimental sample 金属 and the average PL inte...

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Abstract

The invention belongs to the technical field of solar cell testing, in particular to a method for quickly judging the burn-through depth of metal paste without damage. The present invention comprises the following steps in sequence: using a PL tester to separately collect the PL intensity values ​​of the metal slurry area and the non-metal slurry area of ​​the experimental sample; calculating and obtaining an effective PL intensity value. The present invention utilizes the photoluminescence spectrum technology, collects the PL value of the metal paste area and the non-metal paste area, and then calculates and obtains the effective PL intensity value that can directly represent the burn-through depth of the metal paste through a certain calculation method, thereby Judging the burn-through depth of the metal paste, the detection method is simple and convenient, suitable for finding problems in industrial production, and the present invention will not cause damage to the battery itself in the process of judging the burn-through depth of the metal paste, that is, no damage The burn-through depth of the metal paste can be accurately judged.

Description

technical field [0001] The invention belongs to the technical field of solar cell testing, and in particular relates to a method for quickly judging the burn-through depth of metal paste without damage. Background technique [0002] With the rapid development of photovoltaic technology, the pursuit of cost and efficiency of cells has become more and more intense. For cell efficiency, the most important factor is recombination. Recombination includes interface defect recombination, base region defect recombination and recombination brought by metal paste. The influence of interface defect recombination and base region defect recombination is usually tested by making samples with special structures. The composite evaluation brought by metal paste is much more complicated. It is necessary to use chemical reagents, such as aqua regia and other dangerous mixed acid solutions. Metal removal, or observing the burn-through depth and corrosion area under a high-power microscope, or...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/66G01N21/63
CPCH01L22/12G01N21/63
Inventor 崔艳峰袁声召万义茂
Owner 东方日升(江苏)新能源有限公司