High-precision secondary off-axis ellipsoidal reflector optical axis leading-out method and optical system thereof

A technology of ellipsoidal reflector and ellipsoidal mirror, which is applied in optics, optical components, optical devices, etc., can solve the problems of limited precision of optical axis extraction, and achieve the effects of simple and convenient extraction, shortening the time of assembly and adjustment, and low cost

Active Publication Date: 2019-12-10
BEIJING RES INST OF SPATIAL MECHANICAL & ELECTRICAL TECH
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Problems solved by technology

The disadvantage of this method is that the measured aspheric mirror is required to be axisymmetric, that is, circular, which is not suitable for off-axis ellipsoidal mirrors, which are all non-axisymmetri

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  • High-precision secondary off-axis ellipsoidal reflector optical axis leading-out method and optical system thereof
  • High-precision secondary off-axis ellipsoidal reflector optical axis leading-out method and optical system thereof
  • High-precision secondary off-axis ellipsoidal reflector optical axis leading-out method and optical system thereof

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[0041] The present invention will be described in detail below with reference to the drawings and specific embodiments.

[0042] In the high-precision secondary off-axis ellipsoidal mirror optical axis optical extraction method and its optical system of the present invention, the off-axis ellipsoidal mirror is placed in front of the optical interferometer that emits spherical waves, and placed at a short focal position from the apex of the axial ellipsoidal mirror A standard spherical mirror with a small diameter, adjusts the three to be coaxial according to the Seidel coefficient to reflect the light reflected by the off-axis ellipsoidal mirror back to the interferometer. The two optical focal points of the off-axis ellipsoidal mirror are found through the small hole target, and then the parallel light of the interferometer is passed through the two small hole targets at the same time to obtain the optical axis of the off-axis ellipsoidal mirror. Then aim the parallel beam of th...

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Abstract

The invention discloses a high-precision secondary off-axis ellipsoidal reflector optical axis optical leading-out method and an optical system thereof. An off-axis ellipsoidal reflector is arranged in front of an optical interferometer emitting spherical waves, a standard spherical mirror with a very small aperture is arranged at the position away from the vertex short focus of the off-axis ellipsoidal reflector, and the off-axis ellipsoidal reflector, the standard spherical mirror and the optical interferometer are coaxial according to the Seidel coefficient to reflect light reflected by theoff-axis ellipsoidal reflector back to the interferometer. Two optical focuses of the off-axis ellipsoidal reflector are found out through the small hole targets, and then parallel light of the interferometer passes through the two small hole targets at the same time to obtain the optical axis of the off-axis ellipsoidal reflector. And a theodolite is used for aiming at the parallel light beams of the interferometer, and the directions of the parallel light beams are guided to other devices capable of representing the directions. The leading out method is simple, feasible and high in precision, is suitable for off-axis ellipsoidal reflectors with axisymmetric and non-axisymmetric shapes, and has very important application in installation and test of space optical remote sensors.

Description

technical field [0001] The invention relates to a method for optically extracting the vertex normal of an off-axis ellipsoid mirror and its optical system, especially the realization by optical interference technology, which has an important application in the installation and testing of reflective space optical remote sensors. Background technique [0002] The first existing technology is to judge whether the light spot reflected by the aspheric mirror is in the center of the interferometer CCD, and the accuracy is limited by the size of the human eye and the CCD pixel. The second is to place the measured mirror on the centering device by means of a centering device and a sensor, and the displacement sensor measures the displacement at the edge of the mirror surface, then turn the turntable and adjust the measured mirror so that the variation of the displacement measurement value of the displacement sensor is within the allowable tolerance range Inside, after this requireme...

Claims

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Application Information

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IPC IPC(8): G02B27/62G01B11/24G01B9/02
CPCG01B9/02015G01B9/02056G01B11/2441G02B27/62
Inventor 冯晓宇宗肖颖杜建祥侯闹董科李文广
Owner BEIJING RES INST OF SPATIAL MECHANICAL & ELECTRICAL TECH
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