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Double-interface IC card testing method and system and double-interface reader-writer

A test method and test system technology, which is applied in the direction of instruments, record carriers used by machines, electromagnetic radiation induction, etc., can solve the problems of human resource consumption, affecting test efficiency, time-consuming and labor-intensive testing, etc., so as to save labor costs and improve test execution Efficiency, the effect of realizing automated testing

Pending Publication Date: 2019-12-13
EASTCOMPEACE TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

It brings a lot of human resource consumption, and the test is time-consuming and laborious, which affects the test efficiency

Method used

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  • Double-interface IC card testing method and system and double-interface reader-writer
  • Double-interface IC card testing method and system and double-interface reader-writer
  • Double-interface IC card testing method and system and double-interface reader-writer

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Embodiment Construction

[0041] In order to make the purposes, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments It is a part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0042] Please refer to figure 1 , figure 1 A flow chart of a test method for a dual-interface IC card provided in the embodiment of the present application, the test method includes:

[0043] S101: Receive a first test request, and determine that the first test request is a contact test or a non-contact test;

[0044] S102: When the first test requ...

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Abstract

The invention provides a dual-interface IC card test method, which comprises the steps of receiving a first test requirement, and determining that the first test requirement is a contact test or a non-contact test; when the first test requirement is a non-contact test, closing the contact interface communication of the dual-interface reader-writer, and after delaying for a first preset duration, opening the non-contact interface communication to execute a non-contact interface case test; and when the first test requirement is a contact test, closing the non-contact interface communication of the dual-interface reader-writer, and after delaying for a second preset duration, opening the contact interface communication to execute a contact interface case test. The whole testing process does not need human intervention, automatic testing is achieved. Meanwhile, it is not needed to manually plug and unplug the IC card to switch the contact interface and the non-contact interface, the laborcost is saved, and the testing execution efficiency is greatly improved. The invention further provides a double-interface IC card testing system and a double-interface reader-writer, which have the above beneficial effects.

Description

technical field [0001] The application relates to the field of chip testing, in particular to a testing method and system for a dual-interface IC card and a dual-interface reader / writer. Background technique [0002] With the advent of the era of IC card replacement "core", dual-interface IC cards are used in more and more scenarios. It is necessary to test the function and performance of the IC card on the contact interface and non-contact interface respectively. It is necessary for the interactive test of the IC card contact interface and non-contact interface. The traditional test must be done by manual contact / non-contact reading and writing. To switch the interface of the device, someone must be on duty during the test. It brings a lot of human resource consumption, and the test is time-consuming and laborious, which affects the test efficiency. Contents of the invention [0003] The purpose of this application is to provide a test method and system for a dual-inter...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K19/07G06K7/10
CPCG06K19/0722G06K19/0723G06K7/10366
Inventor 张汉就汤中泽赵莹莹刘奇杨海涛李图兰
Owner EASTCOMPEACE TECH
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