Improved high-pressure testing part structure of tester

Abstract

he invention discloses an improved high-pressure test part structure of a tester. The structure comprises a base, wherein a side plate is fixedly arranged on one side of a top end of the base, a mainshaft is fixedly arranged in the middle of the side plate, two limit grooves are formed in the inner part of each limit block, two screw rods are fixedly arranged on the top end of a cross rod, the middle parts of two screw rods are sleeved with springs, one end of each of two springs is fixedly connected with each of two ends of a rotating rod. Through the improved high-pressure testing part structure of the tester disclosed by the invention, a testing block at a high-pressure end is added, and the original single plate is changed as two plates, and the steel wires and rubber bands are replaced with springs; phase blocks which are made of the same materials with a big disk and have the same diameters with the big disk and thicknesses of 13m are adhered at two sides of the high-pressure big disk. The product pins and testing pieces are reliable in contact, the leak detection and mistaken detection are undiscovered, the numerical value is accurate, the instrument damage caused by the detection is eliminated, an operation of frequently changing the steel wires and rubber bands is unnecessary. The maintenance time is reduced, the maintenance cost is reduced, and the equipment operation rate is improved.

Description

technical field [0001] The invention relates to a testing structure, in particular to an improved structure of a high-voltage testing part of a testing machine, which belongs to the technical field of testing machines. Background technique [0002] The existing high-voltage test piece has only one test piece at the high-voltage end, which is pressed with a steel wire or pulled by a rubber band to make it contact with the product pins, and the shoulder width of the large plate bearing the product pins is only 5 mm. The aging of the test piece and the wear and tear of the large plate and the test piece will lead to poor contact between the test piece and the pins, ignition, crash, missed test, and wrong test, which often damage the instrument and meter, seriously affecting the test quality and product qualification rate. . Contents of the invention [0003] The purpose of the present invention is to provide a kind of improved testing machine high-voltage test part structure...

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Problems solved by technology

[0003] The purpose of the present invention is to provide a kind of improved testing machine high-voltage test part structure, to solve the existing high-voltage test piece proposed in the above-mentioned background technology all has only one piece of test piece at the high-voltage end, press with steel wire or rubber band pull, make it It is in contact with the product pins, and the shoulder width of the large plate that bears the product pins is only 5 mm. With the aging of steel wires and rubber bands and the wear of the large plate and test pieces, poor contact problems are caused.

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