A device and method for testing the spectral response of an optical device based on microwave photon down-conversion
A spectral response and test device technology, applied in the field of passive optical device spectrum response test device, can solve problems such as large link loss, unstable detection signal, complex structure, etc., and achieve low loss, avoid use, and simple test system Effect
Active Publication Date: 2022-03-04
SOUTHEAST UNIV
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Problems solved by technology
At present, there are few studies on the combination of down-conversion technology and microwave photon testing. The reported schemes are all realized through parallel links. This structure requires an optocoupler to divide the signal into two paths, so that one of the signals passes through the device, and at the same time The two signals are modulated by radio frequency with similar frequency, then combined by an optical coupler, and finally a low-frequency signal is generated by the beating frequency of a photodetector; Unstable detection signal caused by carrier interference
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[0020] In order to make the purpose, technical solutions and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.
[0021] figure 1 The structural diagram of the optical device spectral response testing device based on microwave photon down-conversion provided by the present invention includes a laser 1, a phase modulator 2, a first radio frequency source 3, a tunable bandpass filter 4, an intensity modulator 6, a second Two radio frequency sources 7, a photodetector 8, and a spectrum analyzer 9; the optical input end of the phase modulator 2 is connected to the output end of the laser 1, and the radio frequency input end of the phase modulator 2 is connected to the output end of the first radio frequency source 3 The input end of the tunable bandpass filter 4 is connected with the output end of the phase modulator 2, and the outp...
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The invention discloses a device and method for testing the spectral response of an optical device based on microwave photon down-conversion. The device includes a laser, a phase modulator, an optical bandpass filter, a device to be tested, an intensity modulator, and a low-speed photodetector. Voltage source, first radio frequency source, second radio frequency source, spectrum analyzer. The method is as follows: the laser light enters the phase modulator, and after being modulated by the microwave signal output by the first radio frequency source, an optical single sideband signal is generated through a bandpass filter, and enters the intensity modulator after passing through the device under test, while the second radio frequency source The output microwave signal with a frequency similar to that of the first radio frequency source enters the intensity modulator, and after further modulation, two low-frequency signals with the same amplitude and phase are generated by the beat frequency of the low-speed photodetector, which are superimposed and detected by the spectrum analyzer. The method can test the device response of the device to be tested within a frequency range by detecting the response at a fixed low frequency; the invention has the advantages of low complexity of the test system, small loss, no need to consider signal interference, and the like.
Description
technical field [0001] The invention relates to a passive optical device spectrum response testing device and method based on microwave photon down-conversion technology, and belongs to the technical fields of microwave photonics, down-conversion technology, and low-frequency detection. Background technique [0002] Optical passive devices, such as microring resonators, tunable optical delay lines, waveguide Bragg gratings, etc., have been widely used in information storage, biomedicine, military radar and other fields. In order to better put the optical passive device into application, it is first necessary to test its transmission characteristics. Considering that wavelength scanning has high requirements on laser accuracy and stability and low test accuracy, frequency scanning test is more suitable for testing high-Q devices because of its higher accuracy and faster speed. When the test range is large, a wide bandwidth photodetector is required to respond. In order to r...
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IPC IPC(8): H04B10/079
CPCH04B10/0795
Inventor 恽斌峰徐雪朦胡国华崔一平
Owner SOUTHEAST UNIV