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Test vector generation method and storage medium based on test object

A technology of test objects and test vectors, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of low efficiency of test vector generation, inconvenient online debugging of test vectors, and poor readability of test vectors, so as to improve the generation efficiency , convenient online debugging, high readability effect

Active Publication Date: 2021-04-23
GREE ELECTRIC APPLIANCES INC
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Problems solved by technology

[0004] The present disclosure provides a test vector generation method and storage medium based on test objects to solve the problems of low test vector generation efficiency, poor readability of converted test vectors and inconvenient online debugging of test vectors existing in related technologies

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  • Test vector generation method and storage medium based on test object
  • Test vector generation method and storage medium based on test object
  • Test vector generation method and storage medium based on test object

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Embodiment Construction

[0031] In order to enable those skilled in the art to better understand the technical solutions in this specification, the technical solutions in the embodiments of the present disclosure will be clearly and completely described below in conjunction with the drawings in the embodiments of this specification. Obviously, the described The embodiments are only some of the embodiments of the present application, not all of them. Based on the embodiments of the present disclosure, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.

[0032] Integrated circuit testing is an important link in the manufacturing process of integrated circuits. Through the testing of integrated circuits, the accuracy and stability of the produced integrated circuits can be detected. The testing of integrated circuits usually needs to be completed by using automated testing equipment ATE, and wh...

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Abstract

The present disclosure provides a test object-based test vector generation method and storage medium. The method for generating a test vector based on a test object includes: acquiring one or more test files according to the test object; processing the test file to obtain data to be output; compiling the data to be output into a waveform format by using a predetermined compiler The data in the waveform format is converted, so as to generate the test vector of the test object. Based on the technical scheme of the present invention, the generation efficiency of the test vector is improved, and the generated test vector has high readability, which is convenient for online debugging of the test vector.

Description

technical field [0001] The present disclosure relates to the technical field of integrated circuit testing, and in particular to a method for generating test vectors based on test objects and a storage medium. Background technique [0002] With the development of science and technology, the integrated circuit industry has been rapidly improved, and the quality and reliability requirements for manufacturing integrated circuit products have also been further improved. In order to ensure that integrated circuit products meet the requirements for use, it is necessary to test the integrated circuit. Taking the test process of IC chips as an example, when using automatic test equipment (ATE, Automatic Test Equipment) to perform various tests on the device under test, it is first necessary to generate test vectors, and use the generated test vectors as excitation signals to input to the device under test In order to detect whether the device under test is qualified or not accordin...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28
CPCG01R31/2851G01R31/2894
Inventor 刘超孙阳余景亮
Owner GREE ELECTRIC APPLIANCES INC