Verification device and verification method of a sliding micrometer
A technology for verification devices and micrometers, which is applied to measuring devices and instruments, and can solve problems such as the inability to accurately and quickly verify the status of sliding micrometer probes and probe measurement errors
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[0038] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be described in detail below. Apparently, the described embodiments are only some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other implementations obtained by persons of ordinary skill in the art without making creative efforts fall within the protection scope of the present invention.
[0039] The purpose of this specific embodiment is to provide a verification device for a sliding micrometer, which solves the problems in the prior art that cannot accurately and quickly verify the state of the probe of the sliding micrometer, whether the probe is suitable for observation, and inaccurate judgments. The problem of measurement error in the observation process.
[0040] Hereinafter, an embodiment will be described with reference to the drawings. ...
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