Fixing and testing device for electronic device
A technology for testing devices and electronic devices, which is applied in the direction of measuring devices, measuring device shells, and parts of electrical measuring instruments, etc., which can solve problems such as easy aging, poor flexibility, and scratched contacts, and achieve simple structure and high product quality. The effect of compact structure and good electrical connection
Active Publication Date: 2021-07-30
芜湖易迅生产力促进中心有限责任公司
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Problems solved by technology
In this process, because the test tool connected with the contact of the element to be tested is relatively sharp, it is easy to cause scratches on the element to be tested, such as in the test system described in WO / 2003 / 049147, which adopts the way of lever contact, and the measuring tip is easy to Scratches the contacts
The test systems in the prior art are generally complex and bulky, and are not suitable for installation on some optical brackets, resulting in poor flexibility
In addition, the existing test system generally does not have a vacuum function or a closed test environment. Due to the influence of the surrounding air, some components to be tested and the measuring components are prone to aging during the test, which affects the accuracy of the test. accuracy
Method used
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[0027] In order to make the technical means, creative features, goals and effects achieved by the present invention easy to understand, the present invention will be further described below in conjunction with specific embodiments.
[0028] Such as Figure 1 to Figure 7 As shown, a fixing and testing device for an electronic device includes a base 1, a locking ring 2, an electric ring assembly 3, an electrical connector 4, an outer cover 5, a holder 6, an electrical contact assembly 7, and a closed ring 11. The locking ring 2 is sleeved on the outer circumference of the base 1 and has an interference fit with it. The electric ring assembly 3 is screwed to the lower part of the base 1 and the electrical connector 4 is installed in the electric ring assembly 3 and can be connected to the electric ring assembly 3. The contact assembly 7 is electrically connected, the outer cover 5 is installed on the base 1 and is located above the base 1, the lower part of the outer cover 5 is l...
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The invention discloses a fixing and testing device for electronic devices, which relates to the technical field of testing electronic devices, including a base, a locking ring, an electric ring assembly, an electrical connector, an outer cover, a retainer, an electrical contact assembly, and a closed ring. The electrical contact assembly is slidably connected in the inner cavity of the holder and can move up and down through the lifting mechanism. The upper part of the holder is also provided with a mounting part for installing the component to be tested. The structure of the invention is simple and compact, and realizes miniaturization and flexibility. High, it can adapt to the test requirements in various situations, and it will not cause scratches to the test components, and realizes fine adjustment.
Description
technical field [0001] The invention belongs to the technical field of electronic device testing, and in particular relates to a fixing and testing device for electronic devices. Background technique [0002] At present, related performance tests for electronic devices are often carried out on a tooling platform, using fixtures to clamp the components to be tested, and then connecting relevant circuits to realize the testing process. In this process, because the test tool connected with the contact of the element to be tested is relatively sharp, it is easy to cause scratches on the element to be tested. For example, in the test system described in WO / 2003 / 049147, it adopts the way of lever contact, and the measuring tip is easy to Scratches the contacts. The test systems in the prior art are generally complex and bulky, and are not suitable for installation on some optical brackets, resulting in poor flexibility. In addition, the existing test system generally does not ha...
Claims
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IPC IPC(8): G01R1/04G01R31/00
CPCG01R1/0408G01R1/0425G01R31/00
Inventor 袁荣方敏李扬吴倩倩王涛
Owner 芜湖易迅生产力促进中心有限责任公司