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Test method, device and equipment of storage system and computer readable storage medium

A storage system and testing method technology, applied in the storage field, can solve problems such as high hardware costs and limited testing tasks

Active Publication Date: 2020-01-17
SUZHOU LANGCHAO INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Most of the existing R&D and testing methods for storage systems are completed in physical machines, the cost of hardware is high, and many test tasks cannot be performed in order to avoid damage to hardware devices, and the test tasks are limited

Method used

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  • Test method, device and equipment of storage system and computer readable storage medium
  • Test method, device and equipment of storage system and computer readable storage medium
  • Test method, device and equipment of storage system and computer readable storage medium

Examples

Experimental program
Comparison scheme
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Embodiment 1

[0052] see figure 1 , figure 1 It is an implementation flowchart of a storage system testing method in an embodiment of the present invention, and the method may include the following steps:

[0053] S101: When receiving the SMART information acquisition request of the target hard disk sent by the target virtual host through the preset target smartctl program, parse the SMART information acquisition request of the target hard disk to obtain the hard disk path information of the target virtual machine.

[0054] When it is necessary to use the target virtual host to test a certain indicator of the storage system, it is necessary to obtain the target hard disk SMART (Self-Monitoring Analysis and Reporting Technology, self-monitoring, analysis and reporting technology) information, so the upper layer in the target virtual machine can The application generates a target hard disk SMART information acquisition request. The target hard disk SMART information acquisition request can b...

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PUM

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Abstract

The invention discloses a test method of a storage system, which comprises the following steps: when a target hard disk SMART information collection request sent by a target virtual host through a preset target intelligentctl program is received, analyzing the target hard disk SMART information collection request to obtain target virtual machine hard disk path information; searching target hard disk SMART information corresponding to the target virtual machine hard disk under the target virtual machine hard disk path information from a hard disk SMART information library; and returning the target hard disk SMART information to the target virtual host, so that the target virtual host performs corresponding storage system test operation by utilizing the target hard disk SMART information. Byapplying the technical scheme provided by the embodiment of the invention, the hardware cost is greatly reduced, and the smooth implementation of various storage system test tasks is promoted. The invention further discloses a testing device and equipment of the storage system and a storage medium, and the corresponding technical effects are achieved.

Description

technical field [0001] The present invention relates to the field of storage technology, in particular to a storage system testing method, device, equipment and computer-readable storage medium. Background technique [0002] With the development of big data and huge data information, it is necessary to develop an effective storage system to store the data. Most of the existing R&D and testing methods for storage systems are completed in physical machines. The cost of hardware is high, and many testing tasks cannot be performed to avoid damage to hardware devices, and testing tasks are limited. [0003] To sum up, how to effectively solve the problems of high hardware cost and limited test tasks is an urgent problem for those skilled in the art. Contents of the invention [0004] The purpose of the present invention is to provide a storage system test method, which greatly reduces the hardware cost and promotes the smooth progress of various storage system test tasks; anot...

Claims

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Application Information

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IPC IPC(8): G06F11/22
CPCG06F11/2205G06F11/2247
Inventor 梁鑫辉
Owner SUZHOU LANGCHAO INTELLIGENT TECH CO LTD