Unlock instant, AI-driven research and patent intelligence for your innovation.

Formation method of package structure

A packaging structure, semiconductor technology, applied in the direction of semiconductor/solid-state device parts, semiconductor devices, electrical components, etc.

Inactive Publication Date: 2020-02-11
TAIWAN SEMICON MFG CO LTD
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

These relatively new semiconductor die packaging technologies face manufacturing process challenges

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Formation method of package structure
  • Formation method of package structure
  • Formation method of package structure

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0041] The following disclosure provides many different embodiments, or examples, for implementing different components of embodiments of the invention. Specific examples of components and configurations are described below to simplify the description of the present disclosure. Of course, these are just examples, not intended to limit the embodiments of the present invention. For example, the following description mentions that the first component is formed on or over the second component, which may include embodiments in which the first and second components are in direct contact, or may include additional components formed on the first and second components between, such that the first and second components are not in direct contact with each other. In addition, this disclosure may repeat reference numerals and / or letters in various examples. This repetition is for simplicity and clarity and does not prescribe a relationship between the various embodiments and / or configurat...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A package structure and a formation method are provided. The method includes disposing a first semiconductor die over a carrier substrate and forming a first protective layer to surround the first semiconductor die. The method also includes forming a dielectric layer over the first protective layer and the first semiconductor die. The method further includes patterning the dielectric layer to forman opening partially exposing the first semiconductor die and the first protective layer. In addition, the method includes bonding a second semiconductor die to the first semiconductor die after theopening is formed. The method includes forming a second protective layer to surround the second semiconductor die.

Description

technical field [0001] Some embodiments of the present invention relate to methods of forming package structures, particularly package structures having stacked semiconductor dies. Background technique [0002] The semiconductor integrated circuit (integrated circuit, IC) industry has experienced rapid growth. Continuous progress in semiconductor manufacturing processes has produced semiconductor devices with more precise features and a high degree of integration. Functional density (ie, the number of interconnected devices per chip area) has generally increased while feature size (ie, the smallest component that can be produced using a fabrication process) has shrunk. This size reduction process generally provides advantages such as increased production efficiency and reduced associated costs. [0003] The chip package not only protects the semiconductor device from external environmental pollution, but also provides a connection interface for the semiconductor device pac...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H01L21/56H01L25/07
CPCH01L21/56H01L25/074H01L25/50H01L2225/06513H01L23/3114H01L25/0652H01L21/568H01L23/3128H01L21/561H01L23/3135H01L2224/18H01L21/76898H01L2225/06524H01L2225/06517H01L2225/06541H01L2224/04105H01L2224/96H01L2224/16145H01L2224/171H01L2224/0401H01L2224/11462H01L2224/11464H01L2224/1145H01L2224/19H01L2224/92122H01L2224/81H01L2224/81203H01L2224/73104H01L2224/73204H01L2224/13082H01L24/16H01L24/32H01L24/20H01L24/96H01L24/81H01L24/19H01L24/73H01L24/92H01L2224/92224H01L2224/81005H01L2224/73259H01L2224/73209H01L2924/00014H01L2224/73201H01L2224/16H01L2224/20H01L23/562H01L24/17H01L2224/02333H01L21/76816H01L2224/83203H01L24/08
Inventor 茅一超张进传卢思维
Owner TAIWAN SEMICON MFG CO LTD