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Software defect detection and extraction method for Java language

A Java language, software defect technology, applied in software testing/debugging, software indicators, software engineering design, etc., to achieve the effect of improving test efficiency, wide application range, and reducing post-maintenance costs

Inactive Publication Date: 2020-02-21
JIANGSU UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] So far, there is no defect detection and extraction method that combines static analysis and dynamic analysis specifically for the Java language.

Method used

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  • Software defect detection and extraction method for Java language
  • Software defect detection and extraction method for Java language
  • Software defect detection and extraction method for Java language

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Embodiment Construction

[0028] In order to deepen the understanding of the present invention, the present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments, which are only used to explain the present invention and do not limit the protection scope of the present invention.

[0029] The invention utilizes the Eclipse development platform and multiple tools to detect and extract the defect information of the software developed based on the Java language, and realizes the prediction of the defect information to guide project development and reliability testing. The detection method includes automatic compilation and detection of source files, a tool for measuring meta-computing, and an automatic extraction and information association tool for web page information. Its main idea is: realize the compilation of the software source code developed by Java language, formulate relevant measurement meta-evaluation standards to detect and scan the co...

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Abstract

The invention belongs to the technical field of software testing, and discloses a software defect detection and extraction method for Java language, which comprises the following steps of: (1) acquiring a data packet file of a Java project, and extracting source code files in formats of . Java, . Class and the like from the data packet file; (2) creating a related project through a Java project development platform Eclipse, loading a source code file of the Java project into the project, and exporting a jar package file of the project through an Export function of the Eclipse; (3) calculatingrelated metric elements of the jar package file through a CKJM measurement tool to generate a report file in an XML format; (4) analyzing the XML report file in the step (3) through an extract _ for _java _ xml.py program, and extracting a value of a corresponding metric element to an Excel table; (5) crawling defect information in the related webpage by using a web crawler tool get.py program, and locally generating a corresponding defect information report; and (6) generating a final defect information report through matching and merging of the metric element information table in the step (4) and the defect information table in the step (5).

Description

technical field [0001] The invention belongs to the technical field of software testing, and specifically relates to a method for detecting and extracting software defects aimed at the Java language. Background technique [0002] Under the vigorous development environment of Internet technology and global cloud computing, the number of developers of Java language has grown rapidly for several consecutive years, and maintains broad prospects and significant advantages. With the continuous expansion of Java application fields, software quality requirements are getting higher and higher, and software defect measurement has become a necessary step in Java software development. The measurement of software defect information is a part of software measurement. The detection and extraction of defect information is to collect and quantify the defect data generated in the process of project development and application, and manage the scattered defect data in a unified manner to make i...

Claims

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Application Information

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IPC IPC(8): G06F11/36G06F8/77G06F8/41
CPCG06F8/427G06F8/77G06F11/3688G06F11/3692
Inventor 李震赵兰杰崔骁松孙晨旭杨柳蒋征骐
Owner JIANGSU UNIV OF SCI & TECH