Serial image data training system and simulation system of cmos image sensor

Abstract

The serial image data training and real-time simulation system of CMOS image sensor relates to a kind of serial image data training and simulation technology field of CMOS image sensor, in order to solve the existing bit correction process of serial data with frequency lower than 200MHz , there is a situation where the data transition edge cannot be detected or a data transition edge is detected. During the simulation process of the transition edge, there are problems such as the situation that the transition edge cannot be detected, including CMOS image sensors, drivers, and level Converter and monolithic controller; In the monolithic controller, include timing control module, data conditioning module, training module, iodelay, iserdes and output position controllable shift register; The present invention includes complete serial image data training The specific topology diagram, the realization goal of channel training, the generation method of parallel data jump edge according to the tap position of iodelay, the specific generation method of the tap position of each channel, and the expression method of abnormal data representing the jump edge.

Description

technical field [0001] The invention relates to the technical field of serial image data training and simulation of a CMOS image sensor, in particular to a serial image data training system and a simulation system of a CMOS image sensor, aiming at the serial image data of a CMOS image sensor below 200MHz Training system and simulation system. Background technique [0002] The serial image data reception of the CMOS detector, for the serial data with a frequency lower than 200MHz, may not detect the data jump edge or detect a data jump edge during the bit correction process, in the case of large interference Occasionally, two transition edges may also occur. In the simulation process of the jump edge, if the description of the jump edge is performed in a different way from the training data, if the duration of the data different from the training data is too long, it may be mistaken for a stable sampling area, resulting in the entire The simulation process is wrong; if it i...

AI Technical Summary

Problems solved by technology

[0003] In order to solve the problem that the existing serial data with a frequency lower than 200MHz is corrected in the bit correction process, there is no data jump edge or a data jump edge is detected, and in the simulation process of the jump edge, There are problems such as the situation where the transition edge cannot be detected, and a serial image data training system and simulation method for a CMOS image sensor are provided

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