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Display panel test circuit and test method

A technology for display panels and test circuits, applied in circuits, nonlinear optics, instruments, etc., can solve problems such as short circuit of test signal pads and abnormal display of display panels, and achieve the effect of avoiding short circuits and improving display effects.

Active Publication Date: 2022-07-12
WUHAN CHINA STAR OPTOELECTRONICS SEMICON DISPLAY TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0004] The embodiment of the present application provides a display panel test circuit and test method to solve the problem that the test signal pad is short-circuited by the conductive foreign matter generated when the laser cuts the display panel, which causes the abnormal display of the display panel

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  • Display panel test circuit and test method

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Embodiment Construction

[0030] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, but not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work fall within the protection scope of the present application.

[0031] In the description of this application, it is to be understood that the terms "center", "thickness", "upper", "lower", "vertical", "horizontal", "inner", "outer", "side" The orientation or positional relationship indicated by etc. is based on the orientation or positional relationship shown in the accompanying drawings, which is only for the convenience of describing the present application and simplifying the description, rather than indicating or i...

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Abstract

The embodiment of the present application discloses a display panel test circuit and a test method, including: a plurality of test signal pads, each of which is connected to a display panel; a plurality of transistors, a plurality of the transistors are connected to a plurality of The test signal pads are in one-to-one correspondence, the source of each transistor is connected to the corresponding signal line, the drain of each transistor is connected to the corresponding test signal pad, and a plurality of the transistors correspond to one a common gate; and a control signal pad connected to the common gate. The solution avoids the short circuit of the test signal pad and improves the display effect of the display panel.

Description

technical field [0001] The present application relates to the field of display technology, and in particular, to a display panel test circuit and a test method. Background technique [0002] In the production process of the display panel, it is necessary to test the performance of the panel at various stages to improve the yield of the display panel. In order to facilitate testing, test signal pads are generally provided on the substrate for receiving external test signals. [0003] However, when the display panel motherboard is cut into multiple small-sized panels by using the laser cutting technology, conductive foreign objects will be generated at the cutting position, such as metal debris from the melting of the signal lines between the small-sized display panels or the carbonization of the flexible substrate. Carbon particles, thus causing short circuit of the test signal pad, causing abnormal display on the display panel. SUMMARY OF THE INVENTION [0004] Embodimen...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02F1/13H01L27/32H01L51/56
CPCG02F1/1309H10K59/10H10K71/00
Inventor 吕林鸿
Owner WUHAN CHINA STAR OPTOELECTRONICS SEMICON DISPLAY TECH CO LTD
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