Deep hole axis scanning measurement device and measurement method thereof

A measuring device and deep hole technology, applied in the field of geometric quantity measurement, can solve the problems of loss of measurement accuracy, expansion of field of view, influence of axis fitting, etc., and achieve the effects of reducing labor load, strong versatility, and improving measurement efficiency

Active Publication Date: 2020-04-03
TIANJIN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In addition, there are currently research teams that use conical mirrors to expand a single laser beam, take images of the expanded laser, and measure the entire closed plane through image processing. This method has sufficient measurement points, but when measuring large-sized workpieces, in order to ensure that the camera captures a complete image, loss of measurement accuracy while enlarging the field of view
The corresponding device uses the ultrasonic dual crystal probe to obtain the thickness of the workpiece to determine the center of the circle, but it is only suitable for the axis measurement of the concentric hole on the cylindrical workpiece
The above-mentioned devices can obtain the relevant information of a certain section inside the hole. In order to obtain the axis information of the measured hole, the measuring device needs to be moved along the axis of the hole. Fitting has some influence

Method used

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  • Deep hole axis scanning measurement device and measurement method thereof
  • Deep hole axis scanning measurement device and measurement method thereof
  • Deep hole axis scanning measurement device and measurement method thereof

Examples

Experimental program
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Effect test

Embodiment 1

[0043] like Figure 1-2 As shown, a scanning measurement device for the axis of a deep hole includes a frame 1, a telescopic mechanism 2 and a scanning mechanism 3. The telescopic mechanism 2 is erected on the frame 1, and the output end of the telescopic mechanism 2 is vertically downward. The output end of telescopic mechanism 2 is connected, and scanning mechanism 3 comprises first fixed plate 31, second fixed plate 32 and six sensors 33, and first fixed plate 31 is vertically connected with the output end of telescopic mechanism 2 by first connecting rod 34, The second fixed plate 32 is arranged in parallel with the first fixed plate 31, and the second fixed plate 32 is connected with the first fixed plate 31 through the second connecting rod, wherein the output ends of the three sensors 33 are arranged on the first fixed circle with the first circumscribed circle. The plate 31 and the output ends of the other three sensors 33 are arranged on the second fixed plate 32 in a...

Embodiment 2

[0052] like Figure 1-2 Shown, the measuring method of the scanning measuring device of a kind of embodiment 1 deep hole axis, comprises the steps:

[0053] S1. Move the deep hole to be measured to directly below the scanning mechanism 3;

[0054] S2. The telescopic mechanism 2 starts to work, pushes the scanning mechanism 3 into the deep hole, and the telescopic mechanism 2 carries the scanning mechanism 3 to perform a stepping motion along the axis with a stepping distance of s, and the displacement sensor collects data once for each step;

[0055] S3, the three sensors 33 on the first fixed plate 31 and the three sensors 33 on the second fixed plate 32 fit the deep hole sections where they are located, and respectively obtain the center position coordinates of the current section;

[0056] S4, through data processing, obtain new circle center position coordinates respectively;

[0057] S5. The axis of the deep hole can be obtained by connecting multiple new center positio...

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Abstract

The invention belongs to the technical field of geometric quantity measurement. The invention particularly relates to a scanning measurement device for a deep hole axis. The device comprises a rack, atelescopic mechanism and a scanning mechanism. The telescopic mechanism is erected on rack, the output end of the telescopic mechanism is vertically downward; the scanning mechanism is connected withthe output end of the telescopic mechanism; the scanning mechanism comprises a first fixing plate, a second fixing plate and six sensors. The first fixed plate is vertically connected with the outputend of the telescopic mechanism through a first connecting rod; the second fixing plate and the first fixing plate are arranged in parallel, the second fixing plate is connected with the first fixingplate through a second connecting rod, the output ends of three sensors are arranged on the first fixing plate together with a first circumcircle, the output ends of the other three sensors are arranged on the second fixing plate together with a second circumcircle, and the first circumcircle and the second circumcircle are coaxial. The scanning measurement device has the characteristics of strong universality, high precision, high efficiency and the like. In addition, the invention further provides a measurement method of the scanning measurement device, so that the working stability and efficiency of the scanning measurement device are improved.

Description

technical field [0001] The invention belongs to the technical field of geometric quantity measurement, and in particular relates to a scanning measurement device and a measurement method for the axis of a deep hole. Background technique [0002] In the measurement of large-sized hole parts, if the measurement is for a simple hole without chamfers, the edge contour of the round hole can be extracted by visual measurement for measurement. This method can obtain the aperture data of the measured hole, but the accuracy of the measurement of the spatial attitude of the hole axis is limited, and the characteristic change of the measured hole along the axial direction cannot be obtained. When the measurement device is deep into the hole to measure the relevant quantity, if the unit displacement sensor is used for measurement, in order to obtain the information of the entire circumferential surface, the measurement device needs to be rotated, and a single sensor is used to achieve c...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B21/00G01B21/02
CPCG01B21/00G01B21/02
Inventor 刘常杰滕文杰
Owner TIANJIN UNIV
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