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A high-speed pulse signal amplitude measurement method

A signal amplitude and high-speed pulse technology, which is applied in the field of high-speed pulse signal amplitude measurement, can solve the problems of high cost and difficult implementation, and achieve the effects of low cost, wide application range and strong anti-interference ability

Active Publication Date: 2021-12-14
JIANGSU UNIV OF SCI & TECH +1
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0006] The technical problem to be solved by the present invention is to provide a high-speed pulse signal amplitude measurement method, which can solve the problem that the existing technology needs to use a high-speed ADC in conjunction with an FPGA high-speed data acquisition circuit to measure the amplitude of the high-speed pulse signal. high problem

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  • A high-speed pulse signal amplitude measurement method
  • A high-speed pulse signal amplitude measurement method
  • A high-speed pulse signal amplitude measurement method

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Embodiment Construction

[0027] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0028] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. The following examples can enable those skilled in the art to understand the present invention more comprehensively, but the present invention is not limited to the scope of the described examples.

[0029] This specific embodiment adopts following technical scheme:

[0030] Such as figure 2 As shown, it is a high-speed pulse signal, the setting amplitude is 1V, the frequency is 500kHz, and the duty cycle is 50%. It can be seen from the figure that the overshoot and ringing of the signal are serious, which brings difficulties to the measurement.

[0031] Such as figure 1 As shown, the present invention takes the high-sp...

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Abstract

The invention discloses a method for measuring the amplitude of a high-speed pulse signal, which relates to the technical field of electronic measurement. Realize the measurement of high-speed pulse signal amplitude under low-speed conditions. Generating a DC scanning voltage U through a precision DC voltage generator d , U d The signal y is obtained by comparing with the pulse signal to be measured through a voltage comparator c , for y c Do low-pass filtering, take its DC component to get y d , to get the DC voltage y of the output signal amplitude d with U d The relationship curve between y d (U d ); for curve y d (U d ) do the first order differential to get the curve y′ d (U d ), for curve y′ d (U d ) do double α filtering to get y′ d (U d ) envelope p(U d ), take the curve p(U d ) corresponding to the minimum value of U d is a measure of the amplitude of the pulse signal. The invention has the advantages of: the measurement of the amplitude of the high-speed pulse signal can be realized without using a high-speed data acquisition circuit, it is easy to realize, and the cost is low, and the change law of the DC signal output by the comparator is used as a reference basis, the anti-interference ability is strong, and the scope of application wide, stable and reliable.

Description

technical field [0001] The invention relates to the technical field of electronic measurement, in particular to a method for measuring the amplitude of a high-speed pulse signal. Background technique [0002] Pulse signal amplitude measurement is the basis for determining pulse waveform parameters, such as pulse rise time, pulse width, preshoot, overshoot, ringing and other parameters. The pulse amplitude needs to be determined first. Only by accurately measuring the pulse amplitude can we Determine the eigenvalues ​​of the above parameters. However, the measurement of the amplitude of the high-speed pulse signal requires the use of a high-speed ADC combined with a high-speed FPGA data acquisition circuit, which is difficult and expensive to implement. [0003] In the prior art, the literature (Wang Yan. Research on pulse signal parameter measurement based on single-chip microcomputer [J]. Electronic Quality, 2018, 381(12): 121-123.) obtains the collected data by threshold ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R29/02
CPCG01R29/02
Inventor 何呈王彪李晓曼芮超群朱柏宇
Owner JIANGSU UNIV OF SCI & TECH