Lightning stroke resistance detection method for chip port

Abstract

The invention discloses a lightning stroke resistance detection method for a chip port. The method comprises the following steps: respectively obtaining a current and voltage curve of a to-be-detectedchip port relative to a power supply end, a grounding end and remaining chip ports; performing a lightning indirect effect test on the to-be-detected chip port; after the lightning indirect effect test, obtaining the current and voltage curve of the to-be-detected chip port relative to the power supply end, the grounding end and the remaining chip ports again; testing the performance and the function of the to-be-detected chip to obtain the performance parameter and the function parameter of the to-be-detected chip after the lightning indirect effect test; comparing the current and voltage curves before and after the lightning indirect effect test to obtain a curve comparison result; and judging whether the to-be-detected chip port is qualified or not according to the performance parameters, the function parameters and the curve comparison result. According to the lightning stroke resistance detection method for the chip port, the hidden damage of the chip port can be detected under the condition that the chip is subjected to the lightning indirect effect test and the chip function and performance test is qualified.

Description

technical field [0001] The invention belongs to the technical field of chip detection, and in particular relates to an anti-lightning detection method of a chip port. Background technique [0002] Section 22 of DO-160G "Lightning Induced Transient Susceptibility" specifies the equipment-level lightning indirect effect test. This test verifies the ability of equipment to withstand the indirect effect of lightning by simulating the transient waveform signal generated by lightning induction. The primary industry standard for verifying the lightning protection capabilities of chip ports. [0003] The lightning induction transient susceptibility test can adopt the pin injection method, inject the transient waveform signal into the chip port through the pin, and then judge whether the chip port has the ability to withstand the indirect effect of lightning according to the function and performance comparison of the chip before and after the test . If the function and performance ...

AI Technical Summary

Problems solved by technology

[0004] However, the existing detection methods cannot detect the hidden damage of the chip port, that is, when the chip port has been damaged after the lightning induction transient sensitivity test, but the chip function and performance are still within the chip index range, the existing detection method The method cannot be judged, which leads to the hidden danger of chip failure in later application

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