Microscopic scanning platform and working area flatness calibration method

A technology of scanning platform and working area, applied in the field of microscope scanning, can solve the problems of unable to scan the platform to scan quickly, unable to determine and adjust the specific position of the defect, and achieve the effect of convenient adjustment

Pending Publication Date: 2020-05-08
HANGZHOU JUNHUI BIOTECHNOLOGY CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to provide a micro-scanning platform and a method for calibrating the flatness of the working area, which has the advantages of being able to quickly scan the flatness of the scanning platform and qui...

Method used

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Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0035] Microscopic scanning platform, including the scanning platform, the scanning platform is a workbench, and the surface of the workbench is provided with an XY coordinate system, and the zero point of the X-axis and the Y-axis meets at the corner of the scanning platform, so the area formed by the X-axis and the Y-axis is located at The first quadrant of the coordinate system, and the X-axis and Y-axis coordinate values ​​are both positive.

[0036] A method for calibrating the flatness of a working area of ​​a microscopic scanning platform includes the following steps:

[0037] The first step: the construction of the mobile device, the support is fixed on the side of the micro-scanning platform, and two driving mechanisms are installed inside the support so that it can move along the X-axis and Y-axis; the driving mechanism is The X-axis driving mechanism and the Y-axis driving mechanism, and the driving power part is a driving cylinder, and the supporting member is a sl...

Embodiment 2

[0045] Microscopic scanning platform, including the scanning platform, the scanning platform is a workbench, and the surface of the workbench is provided with an XY coordinate system, and the zero point of the X-axis and the Y-axis meets at the corner of the scanning platform, so the area formed by the X-axis and the Y-axis is located at The first quadrant of the coordinate system, and the X-axis and Y-axis coordinate values ​​are both positive.

[0046] A method for calibrating the flatness of a working area of ​​a microscopic scanning platform includes the following steps:

[0047] The first step: the construction of the mobile device, the support is fixed on the side of the micro-scanning platform, and two driving mechanisms are installed inside the support so that it can move along the X-axis and Y-axis; the driving mechanism is The X-axis driving mechanism and the Y-axis driving mechanism, and the driving power part is a driving cylinder, and the supporting member is a sl...

Embodiment 3

[0055] Microscopic scanning platform, including the scanning platform, the scanning platform is a workbench, and the surface of the workbench is provided with an XY coordinate system, and the zero point of the X-axis and the Y-axis meets at the corner of the scanning platform, so the area formed by the X-axis and the Y-axis is located at The first quadrant of the coordinate system, and the X-axis and Y-axis coordinate values ​​are both positive.

[0056] A method for calibrating the flatness of a working area of ​​a microscopic scanning platform includes the following steps:

[0057] The first step: the construction of the mobile device, the support is fixed on the side of the micro-scanning platform, and two driving mechanisms are installed inside the support so that it can move along the X-axis and Y-axis; the driving mechanism is The X-axis driving mechanism and the Y-axis driving mechanism, and the driving power part is a driving cylinder, and the supporting member is a sl...

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PUM

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Abstract

The invention relates to the technical field of microscope scanning, especially, to a microscanning platform comprising a scanning platform being a workbench. An XY coordinate system is arranged on the surface of the workbench, and zero points of an X axis and a Y axis are connected to a corner of the scanning platform, so that an area formed by the X axis and the Y axis is located in a first quadrant of the coordinate system, and coordinate values of the X axis and the Y axis are positive values. Besides, the invention also provides a working area flatness calibration method of a microscanning platform. According to the invention, the X axis and the Y axis are adopted to carry out rapid and comprehensive scanning on the scanning platform; the defect position of the scanning platform is determined through the coordinate system; the defect position is marked and recorded, workers can conveniently adjust the scanning platform and correct the defect; and problems that the existing microscopic scanning platform and the existing working area flatness calibration method cannot quickly scan the scanning platform and cannot determine and adjust the specific position of the defect are solved at the same time.

Description

technical field [0001] The invention relates to the technical field of microscope scanning, in particular to a microscope scanning platform and a method for calibrating the flatness of a working area. Background technique [0002] Microscope is a common tool for observing the microscopic world, and is currently widely used in biomedical diagnostic research and industrial production. At present, the use of automatic microscopes is more and more widely, that is, the movement of the slide on the stage, the focusing between the lens and the sample, and the shooting of the sample image are all completed by the linkage between the automatic XY axis stage and the digital camera. [0003] Usually the microscope observation samples are placed on the glass slide, and the glass slide is placed on the working area of ​​the stage, and then illuminated by transmitted light (mostly biological samples) or directly placed on the stage by epi-light illumination (mostly for industrial use) . ...

Claims

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Application Information

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IPC IPC(8): G01N21/88G01N25/72
CPCG01N21/8851G01N25/72G01N2021/8861G01N2021/8874G01N2021/888
Inventor 阎灼辉
Owner HANGZHOU JUNHUI BIOTECHNOLOGY CO LTD
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