Circuit generating double-peak waveform meeting IEC61000-4-2 standard
A waveform and standard technology, applied in the field of component-level electronic device detection, can solve problems such as damage to the TLP machine, complicated modification process, etc., to achieve the effect of simplifying the modification
Active Publication Date: 2020-05-08
PEKING UNIV
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Problems solved by technology
[0005] The embodiment of the present invention provides a circuit for generating a bimodal waveform conforming to the IEC61000-4-2 standard, which is used to solve the modification of the existing internal circuit structure based on the TLP electrostatic generator to generate a bimodal waveform conforming to the IEC61000-4-2 standard There is a risk of damaging the TLP machine, and the modification process is complicated
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[0039]In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0040] The existing method of modifying the circuit structure based on the TLP electrostatic generator to obtain a circuit capable of generating bimodal waveforms usually brings the risk of damaging the TLP machine, and the modification process is complicated. In this regard, an embodiment of the present invention provides a circuit for genera...
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Abstract
The embodiment of the invention provides a circuit and method for generating a double-peak waveform meeting the IEC61000-4-2 standard, and the circuit comprises a TLP generator circuit and a TLP external circuit, and the TLP generator circuit is used for generating TLP excitation; and the TLP external circuit is used for storing energy generated by the TLP excitation and releasing electrostatic excitation in the double-peak waveform. According to the circuit and the method provided by the embodiment of the invention, the risk of damaging a TLP machine table caused by refitting the internal circuit structure of the TLP electrostatic generator is avoided, and meanwhile, compared with the internal refitting of the TLP electrostatic generator, the mode of externally adding the circuit structure is simpler.
Description
technical field [0001] The invention relates to the technical field of component-level electronic device detection, in particular to a circuit and a method for generating a double-peak waveform conforming to the IEC61000-4-2 standard. Background technique [0002] During the packaging, testing, transportation, and manufacturing of IC (integrated circuit, integrated circuit) chips, ESD (Electronic Static Discharge, electrostatic discharge) events will occur in varying degrees, and the chip failure problem caused by electrostatic discharge is an integrated circuit An issue that cannot be ignored by the industry. The test model of electrostatic discharge is divided into component level and system level. For the component level, commonly used electrostatic models are the Human Body Model (HBM for short), the Charge Device Model (CDM for short) and the Machine Model (MM for short). These models are widely used for testing Robustness of component-level electronics. For the syst...
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Login to View More IPC IPC(8): H03K3/02
CPCH03K3/02
Inventor 王源王艺泽田明
Owner PEKING UNIV