Super-resolution total internal reflection microscopy imaging device and method based on polar scattering
A technology of total internal reflection and microscopic imaging, which is applied to methods for obtaining spatial resolution, microscopes, and measuring devices, can solve the problems of narrow field of view, poor universality and slow development of fluorescence super-resolution microscopy, and achieves The effect of resolution enhancement
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[0039] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0040] On the one hand, see attached figure 1 , the embodiment of the present invention discloses a super-resolution total internal reflection microscopic imaging device based on polar scattering, the device includes a polarization illumination module, a beam scanning module and an analysis and detection module, The detection modules are arranged sequentially along the direction of light propagation;
[0041] The polarized lighting module is sequentially prov...
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