Axle defect recognition model construction method and defect recognition method based on machine vision
A defect identification and machine vision technology, applied in the direction of instruments, scientific instruments, measuring devices, etc., can solve problems such as low efficiency, accuracy and consistency of defect identification, and affect production efficiency, so as to meet the requirements of reducing quality and experience and realize Automated analysis, the effect of accurate automated analysis
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Embodiment 1
[0035] refer to figure 1 : A method for building a machine vision-based wheel axle defect recognition model, comprising the following steps:
[0036] Step S100, using the ultrasonic flaw detection equipment to acquire the detection data of the axle, and storing the detection data in a binary file.
[0037] Due to the different geometric features of the wheel rim, web, rim and hollow shaft, the methods of flaw detection are also different, resulting in different detection images. Ultrasonic axle flaw detection equipment obtains the detection data of axle components according to different shaft or wheel types, configures corresponding channels and scanning methods, and stores the detection data in the form of binary files in the upper computer of the flaw detection equipment. The binary files contain position, amplitude , detection parameters, images and other information.
[0038] The channels are probes, and each channel is a probe, and each probe scans according to a certai...
Embodiment 2
[0054] refer to figure 2 : a machine vision-based wheel axle defect recognition method, comprising the following steps:
[0055] Step Z100, using the ultrasonic flaw detection equipment to obtain the detection data of the wheel axle, storing the detection data in a binary file, and extracting the detection image from the binary file.
[0056] This step is the same as in Embodiment 1, and will not be repeated here.
[0057] Step Z200, using the defect recognition model to perform defect recognition on the inspection image.
[0058] After the processing program loads the defect recognition model, input the detection image, the defect lower limit (the lower limit of the pixel size of the target image), the upper limit of the defect (the upper limit of the pixel size of the target image), stepping (the ratio of image division to a certain size), neighborhood (the number of hits ) and other parameters, the computer automatically matches and recognizes defects and outputs defect ...
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