Comprehensive system for measuring conduction and radiation characteristics of packaged antenna
A radiation characteristic and integrated system technology, applied in the antenna radiation pattern and other directions, can solve the problems of delaying the development schedule of the packaged antenna, the test schedule of the packaged antenna cannot be further shortened, and the measurement of the radiation characteristic parameters cannot be performed at the same time, so as to shorten the development time The effect of timing
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0029] Refer to Figure 1 to Figure 3 The integrated system of the present invention for measuring the conduction and radiation characteristics of a packaged antenna is used to measure a packaged antenna 1. The preferred embodiment of the present invention includes a microwave anechoic chamber 2, a radio frequency measurement unit, a chip suction device 5, and a The package test base 6 or, in other embodiments, the integrated system of the present invention may further include a reflector 4, a test carrier 7 and / or a fundamental frequency measurement device 8. For convenience of description, the present invention Figure 1 to Figure 3 and Figure 5 All present the structure of the microwave anechoic chamber 2, the radio frequency measurement unit, the chip suction device 5, the packaging test base 6, the reflector 4, the test carrier 7 and the fundamental frequency measurement equipment 8.
[0030] The microwave anechoic chamber 2 includes a floor 21 and a top plate 22 that face...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com