Sorting machine for testing electronic components

Abstract

The invention relates to a sorting machine for testing electronic components. The sorting machine for testing electronic components according to the present invention is equipped with a test chamber having an access hole that is open to one side, the electronic components are brought into or out of the test chamber from the same access hole by an access device, and the access hole is closed by anopening / closing device when the electronic components are tested. According to the invention, the interior of the test chamber can be isolated from the external temperature environment or light, and the automatic processing of electronic components can be realized at the same time.

Description

technical field [0001] The invention relates to a sorting machine for testing electronic components. Background technique [0002] The produced electronic components will be divided into good products and defective products after being tested by the tester, and only good products can be released from the warehouse. [0003] The electrical connection between the tester and the electronic components is performed by an automated device called a sorter for testing electronic components (hereinafter referred to as a "handler"). [0004] Since the sorting machine needs to be able to accurately connect electronic components and testers, it can be manufactured in various forms according to the type of electronic components. [0005] Of course, the important technology basically required by the sorter is the technology to electrically connect the electronic parts and the tester, but there are also technologies selectively required depending on the test conditions and the kind of ele...

AI Technical Summary

Problems solved by technology

Therefore, if a sorter according to the prior art is applied for testing electronic components for optics, there is a possibility that a test error occurs due to the incidence of disturbing light, which is obvious

Therefore, it is difficult to directly adopt the sorting machine according to the prior art for testing electronic components for optics

[0020] In addition, in order to block stray light, a structure in which the optical electronic components and the tester are electrically connected in a dead insect state (the photosensitive lens is located below and the terminal is located above) is adopted. Since the prior art considers the pick-up of automated electronic components A structure in which the electronic components are electrically connected to the tester in a live bug state (the terminal of the electronic component is at the bottom) is adopted, so it is more difficult to directly use the sorting machine according to the prior art to test the optical electronic components

[0021] In addition, if the electronic components for optics are picked up in the state of living insects like the prior art, the surface of the photosensitive lens may have pick-up marks due to the contact of the pad of the picker (element that can pick up the electronic component) with the surface of the photosensitive lens.

This pick-up mark will eventually reduce the recognition rate of the photosensitive lens and may cause a decrease in the reliability of the test results and product damage

[0022] Moreover, there may be a momentary impact caused by the pressure impact of the pusher caused by the pressurization action or the operation of other components during the test, which may cause the glass material on the impact-sensitive surface to break. Further, There is also the possibility of poor electrical connections between electronic components and test sockets due to vibrations generated by the operation of other components

In particular, since optical electronic components show differences in the recognition rate of light only by slight vibrations, it may be difficult to guarantee the reliability of the test results if the test is performed under the condition of vibration

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