Sorting machine for testing electronic components and pressurizing device thereof

Abstract

The invention relates to a sorting machine for testing electronic components and a pressurizing device thereof. The pressurizing device of the sorting machine for testing the electronic components comprises a pressurizing disc which can move up and down; a pusher which is provided on the lower surface of the pressurizing disc, and which, when the pressurizing disc is moved downward, presses the electronic component downward while contacting the electronic component to electrically connect the electronic component to the test slot, and which, when the pressurizing disc is moved upward, releases the pressure applied to the electronic component; and a pressurizing drive source that causes the electronic component to be pressurized downward or released from pressurization by raising and lowering the pressurizing disc, wherein a first through hole through which light from the lighting device can pass is formed in the pressurizing disc, and a second through hole through which the light passing through the first through hole can pass and irradiate the electronic component is formed in the pusher.

Description

[0001] This application is a divisional application of the invention patent application "Sorting Machine for Electronic Component Testing" with the filing date of November 21, 2019 and the application number of 201911146750.9. technical field [0002] The invention relates to a sorting machine for testing electronic components. Background technique [0003] The produced electronic components will be divided into good products and defective products after being tested by the tester, and only good products can be released from the warehouse. [0004] The electrical connection between the tester and the electronic components is performed by an automated device called a sorter for testing electronic components (hereinafter referred to as a "handler"). [0005] Since the sorting machine needs to be able to accurately connect electronic components and testers, it can be manufactured in various forms according to the type of electronic components. [0006] Of course, the important...

AI Technical Summary

Problems solved by technology

Therefore, if a sorter according to the prior art is applied for testing electronic components for optics, there is a possibility that a test error occurs due to the incidence of disturbing light, which is obvious

Therefore, it is difficult to directly adopt the sorting machine according to the prior art for testing electronic components for optics

[0021] In addition, in order to block stray light, a structure in which the optical electronic components and the tester are electrically connected in a dead insect state (the photosensitive lens is located below and the terminal is located above) is adopted. Since the prior art considers the pick-up of automated electronic components A structure in which the electronic components are electrically connected to the tester in a live bug state (the terminal of the electronic component is at the bottom) is adopted, so it is more difficult to directly use the sorting machine according to the prior art to test the optical electronic components

[0022] Also, if the electronic components for optics are picked up in the state of living insects like the prior art, the surface of the photosensitive lens may have pick-up marks due to the contact of the pad of the picker (element that can pick up the electronic component) with the surface of the photosensitive lens.

This pick-up mark will eventually reduce the recognition rate of the photosensitive lens and may cause a decrease in the reliability of the test results and product damage

[0023] Moreover, there may also be a risk of breaking the glass material on the surface that is vulnerable to impact due to the pressurized impact of the pusher caused by the pressurized action or the instantaneous impact caused by the operation of other components during the test process. Further, There is also the possibility of poor electrical connections between electronic components and test sockets due to vibrations generated by the operation of other components

In particular, since optical electronic components show differences in the recognition rate of light only by slight vibrations, it may be difficult to guarantee the reliability of the test results if the test is performed under the condition of vibration

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