Array substrate detection method and system
A technology of array substrate and detection method, applied in static indicators, instruments, etc., can solve problems such as large subjectivity
Active Publication Date: 2020-06-19
YUNGU GUAN TECH CO LTD
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[0005] Based on this, it is necessary to provide an array substrate detection method and system for artificially observing the light emission of the OLED on the display panel to judge whether there is a Mura phenomenon, which will have a lot of subjectivity.
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[0072] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.
[0073] Because the existing OLED array substrate does not have a precise way to detect electrical Mura. Therefore, the OLED array substrate has the problem that the electrical Mura is discovered late and the improvement is not timely.
[0074] The core idea of the present application is to provide an array substrate to be tested and a test substrate. It is arranged at intervals between the array substrate and the test substrate. Power is supplied to the array substrate and a detection signal is input, so that a plurality of capacitors are formed between the array subst...
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The invention relates to an array substrate detection method and system. By means of the array substrate detection method, whether the array substrate has the Mura phenomenon or not can be determined.Furthermore, the first test block and the second test block are aligned to form a plurality of parallel plate capacitors. And in the plurality of output voltages read from the test substrate, each output voltage corresponds to one position of the test substrate and also corresponds to one position of the array substrate. And judging whether the array substrate has a Mura phenomenon or not according to the plurality of output voltages. When it is detected and judged that the output voltage different from the detection signal input by the array substrate exists, it is considered that the position where the output voltage different from the detection signal input by the array substrate is located is the position where Mura exists in the array substrate. According to the array substrate detection method, the position of the Mura can be confirmed, the specific area with the Mura can be found, and the repairing work of the array substrate can be conveniently achieved.
Description
technical field [0001] The present application relates to the field of display technology, and in particular to an array substrate inspection method and system. Background technique [0002] Organic Light Emitting Diode (OLED for short) display is one of the hot spots in the field of display research today. Compared with a liquid crystal display (LCD for short), an organic light-emitting diode OLED display has the advantages of low energy consumption, low production cost, self-illumination, wide viewing angle, and fast response speed. [0003] Currently, an OLED display panel can be manufactured using an oxide thin film transistor (TFT) process technology. Generally speaking, the type of the thin film transistor in the pixel driving circuit of the OLED display panel manufactured by the oxide thin film transistor process technology can be P-type or N-type, but whether the P-type or N-type thin film transistor is selected To realize the pixel driving circuit, the current of ...
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IPC IPC(8): G09G3/00
CPCG09G3/006
Inventor 王彦磊
Owner YUNGU GUAN TECH CO LTD