Chip testing method and chip testing system

A chip testing and chip technology, which is applied in the field of chip testing methods and chip testing systems, can solve the problems of increased procedures, no records and tracking test results, etc.

Active Publication Date: 2022-06-24
广东利扬芯片测试股份有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, in a test process, it may be necessary to carry out multiple test items on the chip, and the test results of the specific test items are not recorded and tracked. Re-testing, resulting in an increase in the process

Method used

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  • Chip testing method and chip testing system
  • Chip testing method and chip testing system
  • Chip testing method and chip testing system

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Embodiment Construction

[0029] In order to describe the technical content and structural features of the present invention in detail, further description will be given below in conjunction with the specific embodiments and the accompanying drawings.

[0030] see figure 1 and figure 2 , The present invention provides a chip testing method, which is suitable for the chip testing system 100 to test the chips (not shown) and output the tested chips to each discharge port. The chip testing system 100 includes a testing machine 10 and a sorting machine 20, the testing machine 10 is connected to the sorting machine 20 in communication, and the testing machine 10 includes a plurality of test units 101 for testing each test item of the chip.

[0031] Specifically, the chip testing method of the present invention includes:

[0032] S1, configure the testing machine 10 to execute:

[0033] Test the chip through each test unit 101;

[0034] Generate a bin signal for mapping the test results of each test uni...

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PUM

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Abstract

The invention discloses a chip testing method, which is used in a chip testing system. The chip testing system includes a testing machine and a classification machine. The testing machine includes a plurality of testing units. The chip testing method includes: configuring the testing machine to execute: testing the chip through each testing unit ;Generate bin signals according to the test results of each test unit and the pre-configured mapping relationship; transmit the bin signals to the sorter; configure the sorter to execute: receive the bin signals; according to the correspondence between the pre-configured bin signals and each outlet The chip is placed on the tray of the corresponding outlet; the position information of the chip on the tray is recorded, and a map is generated based on the position information of each chip and its corresponding bin signal, which realizes the detailed test results of the chip , the staff can directly see the test results of the chip in each test unit and the distribution details of defective products through the map, so as to make corresponding improvement plans. In addition, the invention also discloses a chip testing system.

Description

technical field [0001] The invention relates to the technical field of chip testing, in particular to a chip testing method and a chip testing system. Background technique [0002] Chip, also known as microcircuit (microcircuit), microchip (microchip), integrated circuit (integrated circuit), refers to a silicon chip containing an integrated circuit, which is small in size and is an important part of electronic equipment such as computers. Due to the fine structure of the chip, the complex manufacturing process and the cumbersome process, it will inevitably leave potential defects in the production process, so that the manufactured chip cannot meet the standard requirements, and may fail due to various reasons at any time. Therefore, in order to ensure the quality of the chip, the chip is usually tested (including multiple test items such as electrical parameter measurement and functional test) in order to separate good and bad products. [0003] At this stage, the chip is ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): B07C5/344B07C5/36
CPCB07C5/344B07C5/362
Inventor 周祥唐绪伟钟峰袁俊张亦锋郑挺郑朝生袁刚张会战辜诗涛魏强容承昌卢旭坤
Owner 广东利扬芯片测试股份有限公司
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