Imaging method of same-plane array capacitive sensor
A technology of capacitive sensor and imaging method, applied in material capacitance, instruments, scientific instruments, etc., can solve problems such as affecting imaging effect, and achieve the effect of improving imaging anti-noise ability and quality
Active Publication Date: 2021-06-22
YANSHAN UNIV
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[0005] The embodiment of the present application provides an imaging method of the same-plane array capacitive sensor, which can solve the problem that the noise affects the imaging effect when the same-plane array capacitive sensor is imaged
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[0037] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.
[0038] It should be understood that when used in this specification and the appended claims, the term "comprising" indicates the presence of described features, integers, steps, operations, elements and / or components, but does not exclude one or more other Presence or addition of features, wholes, steps, operations, elements, components and / or collections thereof.
[0039] It should...
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Abstract
This application is applicable to the technical field of non-destructive testing, and provides an imaging method for the same-plane array capacitive sensor. The above-mentioned imaging method for the same-plane array capacitive sensor includes: establishing a three-dimensional model of the capacitive sensor and the object to be measured, determining the solution area in the three-dimensional model, And divide the solution area into a limited number of solution units; respectively apply a cyclic point voltage excitation signal to each group of electrodes on the capacitive sensor, and calculate the original sensitive field of the solution area; obtain the center coordinates of each solution unit and all electrode pairs Relative point coordinates, and determine the anti-noise operator according to the center coordinates of the solving unit and the relative point coordinates of the electrode pair; determine the optimized sensitive field according to the original sensitive field and the anti-noise operator; determine the dielectric constant distribution matrix according to the optimized sensitive field, and Imaging is performed with the dielectric constant distribution matrix as the gray value. The above method can solve the problem that the noise affects the imaging effect when the same-plane array capacitive sensor is used for imaging.
Description
technical field [0001] The present application belongs to the technical field of non-destructive testing, and in particular relates to an imaging method of a same-plane array capacitive sensor. Background technique [0002] Electrical Capacitance Tomography (ECT for short) technology will lead to changes in the capacitance value between electrode pairs according to the different distribution of the material dielectric constant. Due to the advantages of non-invasiveness, fast response, and high measurement accuracy, it has been widely used in the fields of multiphase flow monitoring in industrial pipelines in recent years, and its electrode arrangement is mainly circular. [0003] In the traditional ECT technology, after calculating the sensitivity field and collecting the capacitance value, the dielectric constant distribution matrix is obtained, and the dielectric constant distribution matrix is used as the gray value for imaging, so as to characterize the change of the...
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IPC IPC(8): G01N27/22
CPCG01N27/221
Inventor 潘钊李鹏程王姗温银堂张玉燕李瑞航李宗亮石沙沙任萍王震宇陈禹伏
Owner YANSHAN UNIV