Reflected light phase information representation device and measurement method thereof

Abstract

The invention discloses a reflected light phase information representation device and a measurement method thereof. The device is divided into a left arm and a right arm, and comprises a light source,a polarizer, a first 1 / 4 wave plate, a first polarization beam splitter, a first sample table, a second polarization beam splitter, a first reflector, a second sample table, a second reflector, a second 1 / 4 wave plate, a polarization analyzer and a detector. The left arm and the right arm rotate around the central axis of a vertical sample table so that the incident angle and the emergent angle can be changed. A light beam is divided into a light path 1 and a light path 2 after passing through the first polarization beam splitter, and the light path 1 and the light path 2 are converged to thesecond polarization beam splitter. The device can measure the intensity and phase information of reflected light of a sample under different incident angle conditions at the same time so that comprehensive information of a reflection spectrum can be obtained, and a practical spectrum detection technology is provided for artificial micro-nano structures such as a metamaterial, an optical antenna and a plasmon array and systems such as an optical film and a natural material.

Description

technical field [0001] The invention relates to the technical field of material surface reflected light intensity and phase detection, in particular to a development and testing method of a spectrum-type reflected light intensity and phase characterization system in ultraviolet, visible-infrared and other bands. Background technique [0002] Reflection usually occurs when an electromagnetic wave is incident on an interface composed of two different media. Compared with the incident light, in many cases, the reflected light not only has a change in amplitude but also a change in phase, and its behavior is finally determined by the two parts of information. For example, when a light beam is incident on the interface of an optically denser medium from an optically rarer medium, the reflected light will undergo a sudden change of π phase, which is equivalent to increasing the optical path of 1 / 2 wavelength in the reflected beam; when the light is incident from an optically dense...

AI Technical Summary

Problems solved by technology

However, the existing technology is very mature in the measurement of spectral intensity information (from which the value of the amplitude can be obtained), but there are not many detection methods for phase information, especially for high-frequency electromagnetic waves such as infrared, visible light, and even ultraviolet light. There are even fewer methods for measuring phase information

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