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Transmission light phase information characterization device and measurement method thereof

A phase information and transmitted light technology, applied in optical radiation measurement, radiation pyrometry, color/spectral property measurement, etc., can solve the problem of rare phase information detection methods, achieve simple phase calculation method and simple optical path construction Effect

Pending Publication Date: 2020-07-24
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, there are not many detection methods for phase information in the prior art, especially for high-frequency electromagnetic waves such as infrared, visible light, and even ultraviolet light.

Method used

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  • Transmission light phase information characterization device and measurement method thereof

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Embodiment 1

[0037] A transmission light phase information characterization device, built as figure 1 The optical path shown, the transmission phase test method includes the following steps:

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Abstract

The invention discloses a transmission light phase information characterization device and a measurement method thereof. The device is composed of a light path 1 and a light path 2, and comprises a light source, a polarizer, a first 1 / 4 wave plate, a first polarization beam splitter, a first sample table, a second polarization beam splitter, a first reflector, a second sample table, a second reflector, a second 1 / 4 wave plate, a polarization analyzer and a detector. A light beam is divided into the light path 1 and the light path 2 after passing through the first polarization beam splitter, and is converged on the second polarization beam splitter. The device can measure the intensity and phase information of sample transmission light at the same time, can obtain comprehensive informationof a transmission spectrum, and provides a practical spectrum detection technology for artificial micro-nano structures such as meta-materials, optical antennas and plasmon arrays as well as systems such as optical films and natural materials.

Description

technical field [0001] The present invention relates to the technical field of electromagnetic wave phase information detection, in particular to a development and testing method of a spectrum-type transmitted light intensity and phase information characterization system in ultraviolet, visible-infrared and other bands. Background technique [0002] Phase is one of the most important basic physical quantities to describe electromagnetic waves. For the transmitted wave, when the electromagnetic wave is incident on the interface composed of two different media, it generally does not change its phase, but when the electromagnetic wave propagates in a medium with a certain thickness, it will be brought along with the increase of the optical path When the electromagnetic wave is incident on a grating composed of periodic spatial structures, the phase of the transmitted wave will be greatly modulated, and thus an interesting diffraction phenomenon will be produced. In recent year...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/25G01J9/00G01J3/447G01J3/02
CPCG01J3/0224G01J3/447G01J9/00G01N21/25
Inventor 郝加明李晓温俞伟伟文政绩周子骥刘锋
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI