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Microscopic angular resolution transmission light phase information characterization system and measurement method thereof

A phase information and transmitted light technology, applied in optical radiation measurement, spectrometry/spectrophotometry/monochromator, radiation pyrometry, etc. Common problems, etc., to achieve the effect of simple calculation method and simple optical path

Pending Publication Date: 2020-09-04
SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

However, there are not many detection methods for phase information in the existing technology, especially for high-frequency electromagnetic waves such as infrared, visible light, and even ultraviolet light, which are angle-resolved under the microscope.

Method used

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  • Microscopic angular resolution transmission light phase information characterization system and measurement method thereof
  • Microscopic angular resolution transmission light phase information characterization system and measurement method thereof
  • Microscopic angular resolution transmission light phase information characterization system and measurement method thereof

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Embodiment 1

[0047] Microscopic angle-resolved transmitted light phase information characterization system and its measurement method, the test method includes the following steps:

[0048] A microscopic angle-resolved transmitted light phase information characterization system and its measurement method, which are constructed as follows figure 1 The optical path shown, the method of measuring the intensity and phase information of the transmitted spectrum is as follows:

[0049] Step 1: Fix the position of the precision translation pinhole 20;

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Abstract

The invention relates to a microscopic angular resolution transmission light phase information characterization system and a measurement method thereof, wherein the device is divided into a light path1 and a light path 2; the two light paths both have microscopic functions, lenses in front of two sample platforms are objective lenses and can be used as Fourier transform devices, and the corresponding relationship between the angle of light emitted by a sample and the position on the focal plane of the objective lenses is achieved; and the light is modulated by the 1 / 4 wave plate and the polarization analyzer at the rear end, and finally, the light is converged to an image plane through the lens. The device can simultaneously measure the intensity and phase information of transmitted lightin a sample micro-region under different incident angle conditions, so that comprehensive information of a transmitted spectrum can be obtained, and therefore a practical spectrum detection technology is provided for artificial micro-nano structures such as a metamaterial, an optical antenna and a plasmon array and systems such as an optical film and a natural material.

Description

technical field [0001] The invention relates to the technical field of transmission light intensity and phase detection in material micro-regions, and in particular to a development and testing method of a spectrum type transmission light intensity and phase characterization system in ultraviolet, visible-near infrared and other bands. Background technique [0002] Phase is one of the basic physical quantities describing electromagnetic waves. For the transmission of electromagnetic waves, when the electromagnetic wave is incident on the interface composed of two different media, its phase will generally not change, but when the electromagnetic wave propagates in a medium with a certain thickness, it will increase with the increase of the optical path It brings about the accumulation of phase, and at the same time, different incident angles will also have a significant impact on the phase. In recent years, metamaterials (metasurfaces) composed of subwavelength artificial mi...

Claims

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Application Information

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IPC IPC(8): G01N21/25G01J3/45G01J3/02G01J9/02
CPCG01J3/0224G01J3/45G01J9/02G01J2009/0249G01J2009/0261G01J2009/0269G01N21/255
Inventor 郝加明李晓温俞伟伟文政绩周子骥刘锋
Owner SHANGHAI INST OF TECHNICAL PHYSICS - CHINESE ACAD OF SCI