Unlock instant, AI-driven research and patent intelligence for your innovation.

Test method, test system, electronic equipment and storage medium

A test system and test method technology, applied in the direction of electrical digital data processing, error detection/correction, and detection of faulty computer hardware, etc., can solve problems such as low test efficiency, network communication interruption, and cumbersome test data input process

Pending Publication Date: 2020-08-11
BEIJING BAIDU NETCOM SCI & TECH CO LTD
View PDF5 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This leads to a cumbersome and inefficient process of filling in test data
[0004] Second, the test method in the form of software generally needs to rely on the network to inject test data. When the bandwidth of the network is not enough to support simultaneous testing of multiple devices, the network communication may be interrupted, so that the current test segment becomes invalid and has to be restarted. , leading to low efficiency
[0005] It can be seen that the current test methods for smart devices need to rely on the memory, network and other conditions of the device under test. This dependence on external conditions often leads to low test efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test method, test system, electronic equipment and storage medium
  • Test method, test system, electronic equipment and storage medium
  • Test method, test system, electronic equipment and storage medium

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] Exemplary embodiments of the present application are described below in conjunction with the accompanying drawings, which include various details of the embodiments of the present application to facilitate understanding, and they should be regarded as exemplary only. Accordingly, those of ordinary skill in the art will recognize that various changes and modifications of the embodiments described herein can be made without departing from the scope and spirit of the application. Also, descriptions of well-known functions and constructions are omitted in the following description for clarity and conciseness.

[0029] The embodiment of this application proposes a kind of test method, adopts figure 1 The block diagram of the hardware simulation test system shown in the figure realizes the hardware simulation test of at least one smart device under test (referred to as the device under test). Such as figure 1 As shown, in the embodiment of the present application, a program...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The embodiment of the invention discloses a test method, a test system, electronic equipment and a storage medium, and relates to the field of intelligent equipment test. The method comprises the steps that a microprocessor control unit sends test data to a programmable logic unit; and the programmable logic unit generates a corresponding test signal according to the test data and sends the test signal to the at least one tested intelligent device. According to the embodiment of the invention, the testing efficiency of the intelligent equipment can be improved.

Description

technical field [0001] The present application relates to the field of smart devices, in particular to the field of smart device testing. Background technique [0002] In the testing process of smart devices, software testing methods are generally adopted. For example, a hook function is set in the software system of the smart device under test, and the test data is poured into the smart device under test by using the hook function. This testing method in the form of software has at least the following defects: [0003] First, when the memory of the smart device under test is not enough to support the input of test data, it is necessary to first fragment the test data to be injected, and then pour the fragmented test data into the smart device under test step by step. This leads to a cumbersome and inefficient process of filling in test data. [0004] Second, the test method in the form of software generally needs to rely on the network to inject test data. When the bandwi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/26
CPCG06F11/261
Inventor 李占学
Owner BEIJING BAIDU NETCOM SCI & TECH CO LTD