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Three-dimensional measurement method and system based on structural illumination and storage medium

A technology of three-dimensional measurement and structured lighting, applied in the field of image processing, can solve problems such as poor measurement results

Active Publication Date: 2020-08-14
SHENZHEN HUAHAN WEIYE TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The technical problem mainly solved by the present invention is how to overcome the problem of poor measurement effect in the existing three-dimensional measurement method

Method used

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  • Three-dimensional measurement method and system based on structural illumination and storage medium
  • Three-dimensional measurement method and system based on structural illumination and storage medium
  • Three-dimensional measurement method and system based on structural illumination and storage medium

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Embodiment 1

[0054] Please refer to figure 1 , the present application discloses an illumination detection system, which includes a light source assembly 11, an imaging device 12, a control device 13 and a processing device 14, which will be described separately below.

[0055] The light source assembly 11 is used to perform pattern illumination on the object W1 to be detected in the illumination area, and needs to project the structured light required for pattern illumination to the object W1 to be detected multiple times. In a specific example, see figure 2 , the light source assembly includes at least one lighting module (such as the module shown by reference numeral 112), and each lighting module 112 is used to project structured light to the object W1 to be detected in the same direction or in different directions. It can be understood that the structured light here refers to the light projection state indicating that the dark light signal is distributed according to a certain rule....

Embodiment 2

[0069] Please refer to Figure 4 , on the basis of the lighting detection system disclosed in Embodiment 1, some structural improvements can also be made to the lighting detection system, for example, the control device 13 and the processing device 14 are integrated in a device main body Z1, specifically, they can be integrated in a circuit On the board, the same processing chip or different processing chips realize the functions of trigger drive control, object imaging control, and image processing, which can reduce hardware overhead, and the user can simultaneously realize detection control and image processing with the main body Z1 of the device Function.

[0070] see Figure 4 , the device main body Z1 is also provided with a detection configuration module 15 signal-connected to the control device 13, the detection configuration module 15 is used to configure the operating parameters of the light source assembly 11 and imaging device 12, so that the control device 13 acco...

Embodiment 3

[0077] Please refer to Figure 7 , On the basis of the illumination detection device disclosed in Embodiment 1 or Embodiment 2, this embodiment discloses a three-dimensional measurement method based on structured illumination, the three-dimensional measurement method includes steps S100-S300, which will be described respectively below.

[0078] Step S100 , acquiring multiple projection images of the object to be detected under the irradiation of multiple projections of structured light. such as in figure 1 with figure 2 Among them, the control device 13 can not only control one of the lighting modules 112 to project the structured light from the same direction multiple times, but also control a group of two lighting modules 112 arranged diagonally to project the structured light alternately from different directions, or control Multiple groups of lighting modules 112 arranged diagonally project structured light alternately from different directions, and it is even possible ...

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Abstract

The invention discloses a three-dimensional measurement method and system based on structured illumination and a storage medium. The three-dimensional measurement method comprises the steps of acquiring a plurality of projection images shot by a to-be-detected object under irradiation of structured light projected for multiple times; performing three-dimensional reconstruction processing on the plurality of projection images according to a preset calibration relationship to obtain a height image of the to-be-detected object; and processing the height image to obtain three-dimensional information of the to-be-detected object. The preset calibration relationship comprises a conversion relationship among the coordinates and the phase of any pixel point in the projection image and the corresponding world coordinate, so that after corresponding phase information is obtained by solving the phase according to the coordinates of any pixel point in the projection image, the three-dimensional coordinate information corresponding to the pixel point can be conveniently calculated according to the calibration relationship, the limitation that the three-dimensional coordinates of the pixel points can be obtained according to the geometric relationship of projection image capturing in the past is avoided, and a new technical thought for calculating the three-dimensional coordinates is provided.

Description

technical field [0001] The invention relates to the technical field of image processing, in particular to a three-dimensional measurement method and system based on structured lighting, and a storage medium. Background technique [0002] With the rapid development of mold design, precision machining, product testing, industrial measurement and other fields, traditional two-dimensional measurement technology can no longer meet the increasingly intelligent, miniaturized and complex production requirements, thus promoting the development of three-dimensional measurement technology and apply. For example, in the process of product inspection, product quality control is a very important task, and the traditional two-dimensional measurement method can no longer meet the application requirements of some scenarios. Due to the high-speed operation of the production line and the automatic operation requirements of the assembly line, the inspection method of relying on manpower to rea...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
CPCG01B11/254
Inventor 杨洋
Owner SHENZHEN HUAHAN WEIYE TECH
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