Inspection method, inspection system and storage medium

Abstract

The invention discloses an inspection method, an inspection system and a storage medium. The inspection method comprises the steps: inspecting whether a to-be-inspected function test item passes or not according to all flag bit results stored in an electronic device, the flag bit results being used for marking whether the function test item corresponding to a flag bit passes or not; when the to-be-verified function test item passes the verification, clearing all zone bit results stored by the electronic device, and storing all zone bit results stored by the electronic device to external equipment; and when the electronic device is rechecked and the function test item does not need to be retested, writing all flag bit results stored by the external equipment into the electronic device to recheck the electronic device. Thus, when the electronic device is retested and the function test item does not need to be retested, all flag bit results stored by the external equipment are written into the electronic device, the function test item does not need to be retested to write new flag bit results into the electronic device, the electronic device can pass the retest quickly, and the test time and cost are saved.

Description

technical field [0001] The present application relates to the technical field of detection, in particular to a detection method, a detection system and a storage medium. Background technique [0002] In the production process of electronic devices such as mobile phones, it is usually necessary to test the functions or performances of the electronic devices to ensure the quality of the electronic devices after leaving the factory. During the testing process of the electronic device, the test result is generally stored in the electronic device, so that it can be determined whether all the test items of the electronic device pass during the verification. [0003] In some related technologies, after all the test items of the verification electronic device are passed, the test results stored in the electronic device are cleared. When retesting a certain test item in the electronic device, if the test item fails, when the electronic device is checked again, since the test results...

AI Technical Summary

Problems solved by technology

When retesting a certain test item in the electronic device, if the test item fails, when the electronic device is checked again, since the test results in the electronic device are cleared, all test items need to be retested, which increases the test time and test costs

Images