Inspection method, inspection system and storage medium

An inspection method and inspection system technology, applied in the field of inspection, can solve the problems of increasing test time and test cost, and achieve the effect of saving test time and cost

Pending Publication Date: 2020-08-14
OPPO CHONGQING INTELLIGENT TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

When retesting a certain test item in the electronic device, if the test item fails, when the electronic device is checked again, since

Method used

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  • Inspection method, inspection system and storage medium
  • Inspection method, inspection system and storage medium
  • Inspection method, inspection system and storage medium

Examples

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Example Embodiment

[0025] The embodiments of the present application are described in detail below. Examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements with the same or similar functions throughout. The following embodiments described with reference to the drawings are exemplary, and are only used to explain the embodiments of the present application, and cannot be understood as limitations on the embodiments of the present application.

[0026] See figure 1 and figure 2 The inspection method of the embodiment of the present application is used for the electronic device 100, and the inspection method includes:

[0027] S10: Check whether the function test item to be verified passes according to the results of all the flag bits stored in the electronic device 100, and the flag bit result is used to mark whether the function test item corresponding to the flag bit passes;

[0028] S20: When the...

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Abstract

The invention discloses an inspection method, an inspection system and a storage medium. The inspection method comprises the steps: inspecting whether a to-be-inspected function test item passes or not according to all flag bit results stored in an electronic device, the flag bit results being used for marking whether the function test item corresponding to a flag bit passes or not; when the to-be-verified function test item passes the verification, clearing all zone bit results stored by the electronic device, and storing all zone bit results stored by the electronic device to external equipment; and when the electronic device is rechecked and the function test item does not need to be retested, writing all flag bit results stored by the external equipment into the electronic device to recheck the electronic device. Thus, when the electronic device is retested and the function test item does not need to be retested, all flag bit results stored by the external equipment are written into the electronic device, the function test item does not need to be retested to write new flag bit results into the electronic device, the electronic device can pass the retest quickly, and the test time and cost are saved.

Description

technical field [0001] The present application relates to the technical field of detection, in particular to a detection method, a detection system and a storage medium. Background technique [0002] In the production process of electronic devices such as mobile phones, it is usually necessary to test the functions or performances of the electronic devices to ensure the quality of the electronic devices after leaving the factory. During the testing process of the electronic device, the test result is generally stored in the electronic device, so that it can be determined whether all the test items of the electronic device pass during the verification. [0003] In some related technologies, after all the test items of the verification electronic device are passed, the test results stored in the electronic device are cleared. When retesting a certain test item in the electronic device, if the test item fails, when the electronic device is checked again, since the test results...

Claims

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Application Information

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IPC IPC(8): G06F11/26
CPCG06F11/26
Inventor 蔡华轩
Owner OPPO CHONGQING INTELLIGENT TECH CO LTD
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