Anti-aging test device for Beidou navigation chip
A technology of Beidou navigation and testing equipment, which is applied in the direction of measuring equipment, electronic circuit testing, measuring electricity, etc., and can solve the problems of unfamiliar process steps, easy forgetting, hand and arm burns and other problems in high temperature aging test chambers
Inactive Publication Date: 2020-08-21
无锡湖山智能科技有限公司
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Problems solved by technology
[0005] In order to solve the above-mentioned technical problems, the present invention provides an anti-aging test device for Beidou navigation chips, to solve the problem that the novice operator used the high-temperature aging test box to perform the chip thermal aging test several times before, because of its specific sensitivity to the high-temperature aging test box. Unfamiliar with the process steps, when the running time of the high-temperature aging test is over, it is easy to forget to stand still for 10-20 minutes, and wait for the exhaust system to dissipate the high-temperature heat inside the high-temperature aging test chamber before opening the door. The problem of heat dissipation after standing for 10-20 minutes leads to the rapid discharge of high-temperature heat when the door is opened, causing burns to the hands and arms of novice operators
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[0030] as attached figure 1 to attach Figure 7 Shown:
[0031]The present invention provides an anti-aging testing device for Beidou navigation chips, comprising: a high-temperature aging test box 1, and a rectangular limiting plate 2 is installed on the front end of the high-temperature aging test box 1 adjacent to the lower right side of the box door; The high-temperature aging test box 1 includes an identification plate 101, a rubber clamping block 102, a rectangular embedded groove 105, and an arc-shaped slot 106. groove 105, and a piece of rubber clamping block 102 is provided on the left side and the right side of the inner end of the rectangular embedded groove 105, and a rubber clamping block 102 is arranged on the top side and the bottom side of the inner end of the rectangular embedded groove 105. The arc-shaped slot 106, the front end of the high-temperature aging test box 1 is located at the lower side of the rectangular embedded groove 105, and a sign 101 is fi...
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The invention provides an anti-aging test device for a Beidou navigation chip. The invention relates to the technical field of anti-aging test equipment, and solves the problem that hands and arms ofa green hand operator are burnt by quickly exhausted high temperature heat due to the fact that the green hand operator forgets to perform standing for 10-20 minutes to dissipate heat when opening a box door. The anti-aging test device for a Beidou navigation chip comprises a high-temperature aging test box, and a rectangular limiting plate is rotatably installed at a position, adjacent to the lower right part of a box door, of the front end face of a high-temperature aging test box body. Through the start of a timer and the design that an arrow sign points to a signboard, the effect of reminding an operator is achieved, and the operator can be prevented from forgetting the operation step of needing standing to wait for cooling, therefore the operator is effectively prevented from being burnt by high temperature.
Description
technical field [0001] The invention belongs to the technical field of anti-aging testing equipment, and more specifically relates to an anti-aging testing device for Beidou navigation chips. Background technique [0002] The current chip thermal aging test method is to install the chip on the PCBA circuit, power it on, put it into a high temperature aging test box, and run it for 4 to 8 hours, or even longer, and then determine the thermal aging test data by observing the parameter changes. [0003] For example, application number: CN201610973308.3 The present invention relates to a new type of high-temperature aging test box, including a bracket and a box body, a box door is provided on the front side wall of the box body, and a motor and a reducer are respectively provided at the outer bottom of the box body. The top of the output shaft is also equipped with a horizontally arranged turntable, and at the same time, a plurality of universal balls are arranged at the bottom ...
Claims
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IPC IPC(8): G01R31/28
CPCG01R31/2862G01R31/2875
Inventor 余超李晨霖
Owner 无锡湖山智能科技有限公司