Test device with temperature compensation function

Abstract

The invention provides a test device with a temperature compensation function, thereby solving problems that the product performance is easy to be abnormal and the product is damaged in severe cases when the existing low-pressure test equipment is used for testing. The device comprises a test box, a vacuum system, an outer sealing cavity pressure sensor, an inner sealing cavity pressure sensor, aninner box and a temperature compensation system, wherein the inner box and the temperature compensation system are arranged in the test box. An outer sealing cavity is formed between the outer wall of the inner box and the inner wall of the test box, and an inner sealing cavity is formed between the inner walls of the inner box; the outer sealing cavity is connected with the vacuum system; a plurality of one-way vent holes are formed in the inner box, inlets of the one-way vent holes are located in the inner sealing cavity, and outlets of the one-way vent holes are located in the outer sealing cavity; the temperature compensation system is arranged in the inner sealing cavity and used for heating the inner sealing cavity; the outer sealing cavity pressure sensor is arranged in the outer sealing cavity, and the output end of the outer sealing cavity pressure sensor is arranged outside the test box; the inner sealing cavity pressure sensor is arranged in the inner sealing cavity, and the output end of the inner sealing cavity pressure sensor sequentially penetrates through the inner box, the outer sealing cavity and the test box and is arranged outside the test box.

Description

technical field [0001] The invention relates to low air pressure test equipment, in particular to a test device with temperature compensation function. Background technique [0002] Aerospace products need to undergo low-pressure tests before they are put into use to verify their functional indicators under corresponding altitude pressures. [0003] At present, the low-pressure test equipment is a test box with a vacuum sealed chamber, and the air extraction system is connected to the vacuum sealed chamber. The system changes the pressure in the vacuum sealed chamber to simulate the product pressure test. During the depressurization process, the air pumping system pumps air to the vacuum sealed chamber. Due to the fast pumping speed of the air pumping system, when the gas passes through the surface of the product under test, it will take away a lot of heat from the product surface, which will greatly reduce the temperature of the product. In this way, additional temperatur...

AI Technical Summary

Problems solved by technology

[0004] In order to solve the technical problem that the temperature of the surface of the test product will drop during the depressurization process of the existing low-pressure test equipment, which will easily lead to abnormal product performance and damage to the product in serious cases, the invention provides a device with temperature Compensation function test device

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