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Complex electronic equipment failure risk transfer relation analysis method based on model system

A transfer relationship and electronic equipment technology, applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., can solve the problems of low efficiency of failure risk transfer relationship analysis, inaccurate analysis results, etc., to reduce cumbersome design activities and improve efficiency effect

Active Publication Date: 2020-09-25
SOUTHWEST CHINA RES INST OF ELECTRONICS EQUIP
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  • Application Information

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Problems solved by technology

[0008] Aiming at the above-mentioned deficiencies in the prior art, the present invention provides a method for analyzing the transmission relationship of failure risks of complex electronic equipment based on a model system, which solves the problems of low analysis efficiency and inaccurate analysis results of the transmission relationship of failure risks of complex electronic equipment

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  • Complex electronic equipment failure risk transfer relation analysis method based on model system
  • Complex electronic equipment failure risk transfer relation analysis method based on model system
  • Complex electronic equipment failure risk transfer relation analysis method based on model system

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Embodiment Construction

[0034] The specific embodiments of the present invention are described below so that those skilled in the art can understand the present invention, but it should be clear that the present invention is not limited to the scope of the specific embodiments. For those of ordinary skill in the art, as long as various changes Within the spirit and scope of the present invention defined and determined by the appended claims, these changes are obvious, and all inventions and creations using the concept of the present invention are included in the protection list.

[0035] Such as figure 1 As shown, a model system-based method for analyzing the transfer relationship of failure risks of complex electronic equipment includes the following steps:

[0036] S1. Establish a system engineering model of complex electronic equipment;

[0037] For complex electronic equipment, use the SysML system modeling language to construct the system engineering model of the equipment. The model architectu...

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Abstract

The invention discloses a complex electronic equipment failure risk transfer relation analysis method based on a model system. The invention provides a failure risk transfer relationship analysis model and a failure risk transfer relationship automatic analysis algorithm of equipment, and realizes automatic establishment of failure risk transfer relationships between upper and lower layers of constituent units such as subsystems, modules and components of complex electronic equipment. Compared with an existing method for manually analyzing the failure risk transfer relation of the complex electronic equipment, the invention has the advantages that the problems of high complexity, poor efficiency, insufficient accuracy and the like caused by manual analysis in traditional failure risk transfer relation analysis work are solved, and the failure risk transfer relation analysis efficiency and the design quality are improved.

Description

technical field [0001] The invention relates to the technical field of transmission relationship of failure risk of complex electronic equipment, in particular to a method for analyzing the transmission relationship of failure risk of complex electronic equipment based on a model system. Background technique [0002] In the process of analyzing the failure risk transmission relationship of complex electronic equipment, the analysis is often carried out by relying on the experience and subjective knowledge of the design team. At present, there is no automatic failure risk transmission relationship analysis method that can be applied in actual engineering, and it can only rely on experienced research and development. Designers rely on experience and subjective judgment, which often leads to incomplete and incomprehensible failure mode analysis, and it is easy to miss the transmission relationship between failure mode and failure risk, and the analysis efficiency is low. [000...

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Application Information

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IPC IPC(8): G06F30/20G06F119/02
CPCG06F30/20G06F2119/02
Inventor 宋悦刚邓林秦希佳江浩王步冉王萌彭祥飞
Owner SOUTHWEST CHINA RES INST OF ELECTRONICS EQUIP