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Vertical semiconductor devices

一种半导体、器件的技术,应用在垂直半导体器件领域,能够解决劣化、VNAND闪存器件操作故障特性等问题

Active Publication Date: 2020-09-29
SAMSUNG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, VNAND flash memory devices may suffer from operational failure or characteristic degradation

Method used

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  • Vertical semiconductor devices
  • Vertical semiconductor devices
  • Vertical semiconductor devices

Examples

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Embodiment Construction

[0033] Example embodiments will be more clearly understood from the following detailed description taken in conjunction with the accompanying drawings.

[0034] Hereinafter, directions substantially parallel to the upper surface of the substrate and intersecting each other (eg, perpendicular) are respectively defined as first and second directions, and directions substantially perpendicular to the upper surface of the substrate are defined as vertical directions.

[0035] figure 1 is a cross-sectional view illustrating a vertical semiconductor device according to an example embodiment. figure 2 is a cross-sectional view illustrating a vertical semiconductor device according to an example embodiment.

[0036] refer to figure 1 , the vertical semiconductor device may include a first substrate 102 on which vertical memory cells are formed and a second substrate 200 on which peripheral circuits are formed. The adhesive layer 104 may be formed on the lower surface of the firs...

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PUM

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Abstract

The invention provides a vertical semiconductor device including a plurality of vertical memory cells on an upper surface of a first substrate, an adhesive layer on a lower surface of the first substrate that is opposite to the upper surface of the first substrate, a second substrate having first peripheral circuits thereon, a lower insulating interlayer on the second substrate, and a plurality ofwiring structures electrically connecting the vertical memory cells and the first peripheral circuits. A lower surface of the adhesive layer and an upper surface of the lower insulating interlayer may be in contact with each other.

Description

technical field [0001] Some example embodiments relate to vertical semiconductor devices and / or methods of manufacturing the same. Background technique [0002] Since the device is highly integrated, a vertical NAND (VNAND) flash memory device may have a cell-on-periphery (COP) structure in which vertical memory cells are formed on a peripheral circuit on a substrate. In this case, peripheral circuits may be degraded during formation of vertical memory cells. Therefore, VNAND flash memory devices may suffer from operational failure or characteristic degradation. Contents of the invention [0003] Some example embodiments provide vertical semiconductor devices having excellent electrical characteristics. [0004] Some example embodiments provide methods of fabricating vertical semiconductor devices having improved electrical characteristics. [0005] According to an example embodiment, a vertical semiconductor device may include: a plurality of vertical memory cells on a...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L27/11529H01L27/11556H01L27/11573H01L27/11582
CPCH10B41/41H10B43/40H10B41/27H10B43/27H01L21/76898H10B41/50H10B43/50H10B43/30H01L23/481
Inventor 梁宇成任峻成黄盛珉金志荣金智源
Owner SAMSUNG ELECTRONICS CO LTD
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