A technique of sampling, sensing, reading and / or determining the data state of a
memory cell of a
memory cell array (for example, a
memory cell array having a plurality of memory cells which consist of an electrically floating body
transistor). In one embodiment, the present inventions are directed to a memory
cell, having an electrically floating body
transistor, and / or a technique of reading the data state in such a memory
cell. In this regard, the present inventions employ the intrinsic bipolar
transistor current to read and / or determine the data state of the electrically floating
body memory cell (for example, whether the electrically floating
body memory cell is programmed in a State “0” and State “1”). During the read operation, the data state is determined primarily by or sensed substantially using the bipolar current responsive to the read control signals and significantly less by the interface channel current component, which is negligible relatively to the bipolar component. The bipolar transistor current may be very sensitive to the floating body potential due to the high
gain of the intrinsic bipolar transistor. As such, the
programming window obtainable with the bipolar reading technique may be considerably higher (for example, up two orders of magnitude higher) than the
programming window employing a conventional reading technique (which is based primarily on the interface channel current component.